PEB24901HV1.2 Lantiq, PEB24901HV1.2 Datasheet - Page 32

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PEB24901HV1.2

Manufacturer Part Number
PEB24901HV1.2
Description
Manufacturer
Lantiq
Datasheet

Specifications of PEB24901HV1.2

Lead Free Status / Rohs Status
Supplier Unconfirmed
3.3
3.3.1 Loops
For test of the line cards, several test loops are provided which can be controlled from
the exchange. When a test loop is closed, all channels (B + B + D) are looped back and
data from the other end of the line is ignored. There are no separate loops for single
channels.
All test loops are transparent loops. During test loops, the line signal is still transmitted.
Nevertheless, the NT receives this signal and synchronizes on it. It can not distinguish
between line signals sent from LT during loop 1 or loop 4, and signals sent during normal
operation.
3.3.1.1
Figure 10
Test Loops Closed by the Quad IEC or under its Remote Control
Loops 1 and 4 are closed in the IEC as near to the Uk0 interface as possible. Using
internal switches in the Quad IEC AFE, the signal from the line driver is fed back directly
to the input. It is like a short-circuit between the pins AOUT and AIN as well as between
Semiconductor Group
Maintenance Functions
Switching an Analog Loop
loop 2
PBX or Terminal
SBC
ICC
ICC
NT
IEC-T
IEC-T
IEC-T
loop 3
loop 2
IEC-T
loop 4
31
Repeater
Uko
IEC-T
1/4 Quad IEC-T
loop 1
PEB 24901
02.95

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