C2012X7R1E225M TDK Corporation, C2012X7R1E225M Datasheet - Page 11

• Manufacturer Part Number: C2012X7R1E225M
• Description: CAP CER 2.2UF 25V 20% X7R 0805
• Manufacturer: TDK Corporation
• Series: Cr

Specifications of C2012X7R1E225M

• Capacitance: 2.2µF
• Voltage - Rated: 25V
• Tolerance: ±20%
• Temperature Coefficient: X7R
• Mounting Type: Surface Mount, MLCC
• Operating Temperature: -55°C ~ 125°C
• Applications: General Purpose
• Ratings: -
• Package / Case: 0805 (2012 Metric)
• Size / Dimension: 0.079" L x 0.049" W (2.00mm x 1.25mm)
• Height - Seated (max): -
• Thickness (max): 0.057" (1.45mm)
• Lead Spacing: -
• Features: -
• Lead Style: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 445-7570-2

(continued)
No.
15 Moisture
Resistance
Item
Capacitance
Q
External
appearance
(Class1)
D.F.
(Class2)
Insulation
Resistance
No mechanical damage.
Characteristics
500MΩ or 25MΩ·μF min.
(As for the capacitors of rated
voltage 16, 10, 6.3V DC and item
below, 500MΩ or 5MΩ·μF min.,)
whichever smaller.
C1005X5R1E683
C1005X5R1E104
C1608X5R1E334
C1608X5R1E474
C1608X5R1E684
C1608X5R1E105
C2012X5R1E335
C2012X5R1E475
C : Rated capacitance (pF)
X5R : 200% of initial spec. max.
X7R : 200% of initial spec. max.
Y5V : 150% of initial spec. max.
30pF and over
Capacitance
Class1
Characteristics
Class2
Under 30pF
Performance
C0G
X5R
X7R
Y5V
—— 10 ——
Please refer to
the table A in
the end of the
specification.
100+10/3×C min.
Change from the
value before test
200 and over
Q
Reflow solder the capacitors on a
P.C.Board shown in Appendix 1a or
Appendix 1b before testing.
Apply the rated voltage at temperature
40±2°C and 90 to 95%RH for 500
+24,0h.
Charge/discharge current shall not
exceed 50mA.
Leave the capacitors in ambient
condition for 6 to 24h (Class1) or
24±2h (Class2) before measurement.
Voltage conditioning (only for class 2)
Voltage treat the capacitors under
testing temperature and voltage for 1
hour.
Leave the capacitors in ambient
condition for 24±2h before
measurement.
Use this measurement for initial value.
Test or inspection method