SAM3N1B Atmel Corporation, SAM3N1B Datasheet - Page 202

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SAM3N1B

Manufacturer Part Number
SAM3N1B
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of SAM3N1B

Flash (kbytes)
64 Kbytes
Pin Count
64
Max. Operating Frequency
48 MHz
Cpu
Cortex-M3
# Of Touch Channels
17
Hardware Qtouch Acquisition
No
Max I/o Pins
34
Ext Interrupts
34
Quadrature Decoder Channels
2
Usb Speed
No
Usb Interface
No
Spi
3
Twi (i2c)
2
Uart
4
Ssc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
10
Adc Resolution (bits)
10
Adc Speed (ksps)
384
Resistive Touch Screen
No
Dac Channels
1
Dac Resolution (bits)
10
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
8
Self Program Memory
YES
Dram Memory
No
Nand Interface
No
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
1.62 to 3.6
Fpu
No
Mpu / Mmu
no / no
Timers
6
Output Compare Channels
6
Input Capture Channels
3
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes
11.3
11.3.1
11.3.2
202
Application Examples
SAM3N
Debug Environment
Test Environment
Figure 11-2
standard debugging functions, such as downloading code and single-stepping through the pro-
gram and viewing core and peripheral registers.
Figure 11-2. Application Debug Environment Example
Figure 11-3
and interpreted by the tester. In this example, the “board in test” is designed using a number of
JTAG-compliant devices. These devices can be connected to form a single scan chain.
shows a complete debug environment example. The SWJ-DP interface is used for
shows a test environment example (JTAG Boundary scan). Test vectors are sent
SAM3-based Application Board
Emulator/Probe
Connector
SWJ-DP
SWJ-DP
SAM3
Host Debugger
PC
11011A–ATARM–04-Oct-10

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