E6435BHFT Semtech Corporation, E6435BHFT Datasheet - Page 25

• Manufacturer Part Number: E6435BHFT
• Description: Per-pin Electronics Companion DAC
• Manufacturer: Semtech Corporation

Latched Data readback via LD_OUT
Figure 14 provides a Functional Block Diagram of the
means to readback, via LD_OUT, the status of latch’s input
into a selected DAC.
A DAC’s latches are addressed for readback in the same
way they are addressed to be written via the serial input,
SDIN.
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
2006 Semtech Corp. / Rev. 3, 8/25/06
DACSEL
TESTMODE
Figure 14. Latched Data Readback Functional Block Diagram
13
D
R
D
R
RANK
A
B
SEL
A DACs Rank A or Rank B latches are selcted by the RANK
input for subsequent readback.
Readback is enabled internally by TESTMODE high
whereupon the selected DAC’s Rank A or Rank B latch
outputs are loaded into the READBACK REGISTER by a
leading edge of CLKIN while SHIFTOUT* is high. With
SHIFTOUT* low, subsequent clocks into CLKIN will shift
out, via LD_OUT, the status of the selected DAC’s latches
of Rank A or Rank B.
R
25
READBACK
REGISTER
13
DAC
C
1
Edge6435/6436
D
C
SHIFTOUT*
LD_OUT
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