HY27US16281A Hynix Semiconductor, HY27US16281A Datasheet - Page 3
HY27US16281A
Manufacturer Part Number
HY27US16281A
Description
(HY27USxx281A) 128Mbit (16Mx8bit / 8Mx16bit) NAND Flash Memory
Manufacturer
Hynix Semiconductor
Datasheet
1.HY27US16281A.pdf
(44 pages)
www.DataSheet4U.com
FEATURES SUMMARY
HIGH DENSITY NAND FLASH MEMORIES
NAND INTERFACE
SUPPLY VOLTAGE
Memory Cell Array
PAGE SIZE
BLOCK SIZE
PAGE READ / PROGRAM
COPY BACK PROGRAM MODE
FAST BLOCK ERASE
Rev 0.6 / Nov. 2005
- Cost effective solutions for mass storage applications
- x8 or x16 bus width.
- Multiplexed Address/ Data
- Pinout compatibility for all densities
- 3.3V device: VCC = 2.7 to 3.6V
- x8 device : (512 + 16 spare) Bytes
- x16 device: (256 + 8 spare) Words
- x8 device: (16K + 512 spare) Bytes
- x16 device: (8K + 256 spare) Words
- Random access: 10us (max.)
- Sequential access: 3.3V device: 50ns (min.)
- Page program time: 200us (typ.)
- Fast page copy without external buffering
- Block erase time: 2ms (Typ.)
= (512+16) Bytes x 32 Pages x 1,024 Blocks
= (256+8) Words x 32 pages x 1,024 Blocks
: HY27US08281A
: HY27US16281A
: HY27USXX281A
128Mbit (16Mx8bit / 8Mx16bit) NAND Flash
STATUS REGISTER
ELECTRONIC SIGNATURE
CHIP ENABLE DON'T CARE OPTION
AUTOMATIC PAGE 0 READ AT POWER-UP OPTION
SERIAL NUMBER OPTION
HARDWARE DATA PROTECTION
DATA INTEGRITY
PACKAGE
- Manufacturer Code
- Device Code
- Simple interface with microcontroller
- Boot from NAND support
- Automatic Memory Download
- Program/Erase locked during Power transitions
- 100,000 Program/Erase cycles
- 10 years Data Retention
- HY27US(08/16)281A-T(P)
- HY27US(08/16)281A-S(P)
: 48-Pin TSOP1 (12 x 20 x 1.2 mm)
: 48-Pin USOP1 (12 x 17 x 0.65 mm)
- HY27US(08/16)281A-T (Lead)
- HY27US(08/16)281A-TP (Lead Free)
- HY27US(08/16)281A-S (Lead)
- HY27US(08/16)281A-SP (Lead Free)
HY27US(08/16)281A Series
3