S-8261 Seiko Instruments, S-8261 Datasheet - Page 12

• Manufacturer Part Number: S-8261
• Description: Battery Protection IC for Single-Cell Pack
• Manufacturer: Seiko Instruments

S-8261AAU, S-8261AAX, S-8261ABA
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
S-8261AAV
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
12
[DELAY TIME] 25 °C
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
[DELAY TIME] −40 °C to +85 °C
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
[DELAY TIME] 25 °C
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
[DELAY TIME] −40 °C to +85 °C
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
is guaranteed by design, not tested in production.
is guaranteed by design, not tested in production.
Parameter
Parameter
*1
*1
Symbol
Symbol
t
t
t
t
SHORT
SHORT
SHORT
SHORT
t
t
t
t
t
t
t
t
t
lOV1
lOV2
t
lOV1
lOV2
t
lOV1
lOV2
t
lOV1
lOV2
t
t
t
t
CU
CU
CU
CU
DL
DL
DL
DL
condition
condition
Test
Test
10
10
10
10
10
10
10
10
10
10
10
10
9
9
9
9
9
9
9
9
Seiko Instruments Inc.
Table 10
Table 9
Remark
Remark




















Min.
Min.
115
220
150
115
450
310
3.7
7.2
1.8
2.5
1.2
3.7
7.2
3.6
2.5
2.5
80
80
5
5
Typ.
2.24
2.24
Typ.
144
320
144
320
144
600
144
600
4.6
4.6
4.6
4.5
4.6
4.5
9
9
9
9
Max.
Max.
1020
173
380
245
540
173
720
245
5.5
2.7
7.8
3.8
5.5
5.4
7.8
7.7
11
15
11
15
Rev.1.9
Unit
Unit
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
µs
µs
µs
µs
s
s
s
s
circuit
circuit
Test
Test
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
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