S-8261 Seiko Instruments, S-8261 Datasheet - Page 13

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S-8261

Manufacturer Part Number
S-8261
Description
Battery Protection IC for Single-Cell Pack
Manufacturer
Seiko Instruments
Datasheet

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S-8261ABD
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
S-8261ABG, S-8261ABI, S-8261ABL
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
[DELAY TIME] 25°C
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
[DELAY TIME] −40°C to +85°C
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
[DELAY TIME] 25°C
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
[DELAY TIME] −40°C to +85°C
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
Rev.1.9
is guaranteed by design, not tested in production.
is guaranteed by design, not tested in production.
_00
Parameter
Parameter
*1
*1
Symbol
Symbol
t
t
t
t
SHORT
SHORT
SHORT
SHORT
t
t
t
t
t
t
t
t
t
lOV1
lOV2
t
lOV1
lOV2
t
lOV1
lOV2
t
lOV1
lOV2
t
t
t
t
CU
CU
CU
CU
DL
DL
DL
DL
condition
condition
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
Test
Test
10
10
10
10
10
10
10
10
10
10
10
10
9
9
9
9
Seiko Instruments Inc.
9
9
9
9
Table 11
Table 12
Remark
Remark
Min.
1.48
5.76
2.88
1.11
68.9
4.31
2.16
Min.
0.96
358
268
220
150
7.2
1.8
0.7
1.2
92
29
20
5
Typ.
1.84
1.84
Typ.
2.24
2.24
115
488
115
488
320
320
7.2
3.6
7.2
3.6
1.2
1.2
36
36
9
9
182.3
11.59
Max.
Max.
4.32
2.89
5.68
138
586
770
380
540
2.2
8.8
1.4
2.7
2.0
3.8
S-8261 Series
43
11
61
15
Unit
Unit
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
µs
µs
µs
µs
s
s
s
s
circuit
circuit
Test
Test
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
13

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