TS8388BCFX/X Atmel Corporation, TS8388BCFX/X Datasheet - Page 10

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TS8388BCFX/X

Manufacturer Part Number
TS8388BCFX/X
Description
ADC 8-bit 1 Gsps
Manufacturer
Atmel Corporation
Datasheet
3.5.
3.6.
Preliminary Beta-Site
Specification
10
10
EXPLANATION OF TEST LEVELS
Only MIN and MAX values are guaranteed (typical values are issuing from characterization results).
(1)
WAFER SCREENING
where Tj ,Tc and Ta are junction, case and ambient temperature respectively.
(2)
Unless otherwise specified, all tests are pulsed tests : therefore Tj = Tc = Ta,
where Tj ,Tc and Ta are junction, case and ambient temperature respectively.
Unless otherwise specified, all tests are pulsed tests : therefore Tj = Tc = Ta,
IV
VI
D
III
V
II
I
DC Accuracy @ 50 MSPS / 10 MHz
50MSPS / 25MHz
No missing codes
AC Performance
100 % wafer tested at +25 C
100% production tested at +25 C
100 % production tested at +25 C
Sample tested only at specified temperatures
Parameter is guaranteed by design and characterization testing (thermal steady-state conditions at
specified temperature).
Parameter is a typical value only
100 % production tested over specified temperature range.
TS8388BF
Parameter
ENOB
SNR
DNL
INL
(1)
(1)
(1)
(for packaged device).
, and sample tested at specified temperatures
Temperature
25 C
25 C
(2)
(2)
Min
0.6
0.8
7.1
45
JTS8388B chip
Guaranteed
Max
Unit
LSB
LSB
dB
bit

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