MX26LV004T Macronix, MX26LV004T Datasheet - Page 19

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MX26LV004T

Manufacturer Part Number
MX26LV004T
Description
(MX26LV004T/B) 4M-Bit CMOS Single Voltage Flash Memory
Manufacturer
Macronix
Datasheet
AC CHARACTERISTICS TA = 0
Table 9. READ OPERATIONS
TEST CONDITIONS:
• Input pulse levels: 0V/3.0V.
• Input rise and fall times is equal to or less than 5ns.
• Output load: 1 TTL gate + 100pF (Including scope and
• Reference levels for measuring timing: 1.5V.
P/N:PM1099
SYMBOL PARAMETER
tRC
tACC
tCE
tOE
tDF
tOEH
tOH
jig), for 26LV004T/B-70. 1 TTL gate + 30pF (Including
scope and jig) for 26LV004T/B-55.
Read Cycle Time (Note 1)
Address to Output Delay
CE to Output Delay
OE to Output Delay
OE High to Output Float (Note1)
Output Enable Read
Hold Time
Address to Output hold
Toggle and Data Polling
o
C to 70
o
C, VCC = 3.0V~3.6V
26LV004T/B-55
MIN.
55
0
0
10
0
19
NOTE:
1. Not 100% tested.
2. tDF is defined as the time at which the output achieves
the open circuit condition and data is no longer driven.
MAX.
55
55
25
25
MX26LV004T/B
26LV004T/B-70
MIN.
70
0
0
10
0
MAX. UNIT CONDITIONS
70
70
30
30
ns
ns
ns
ns
ns
ns
ns
ns
REV. 0.02, JUL. 12, 2004
CE=VIL
CE=OE=VIL
OE=VIL
CE=VIL
CE=OE=VIL

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