ssc-swts903 Seoul Semiconductor, ssc-swts903 Datasheet - Page 13

• Manufacturer Part Number: ssc-swts903
• Description: Chip Device Led
• Manufacturer: Seoul Semiconductor

SSC-QP-0401-06(REV.0)
13. Reliability
(1) TEST ITEMS AND RESULTS
Moisture Resistance
(2) CRITERIA FOR JUDGING THE DAMAGE
Temperature Cycle
(Reflow Soldering)
High Temperature
High Temperature
Low Temperature
Low Temperature
U.S.L. : Upper Standard Level
L.S.L. : Lower Standard Level
Thermal Shock
Soldering Heat
High Humidity
Luminous Intensity
Heat Life Test
Resistance to
TEST ITEM
Solderability
Forward Voltage
Reverse Current
Heat Load
Humidity
Life Test
Life Test
Life Test
Storage
Storage
Cycle
Item
148-29 Kasan-Dong, Keumchun-Gu, Seoul, Korea
Symbol
Pre treatment 30℃,70%, 168hrs
T
TEL: [phone] FAX: [phone]
a
30min. 5min. 30min. 5min.
V
-40°C~25°C~100°C~25°C
I
I
SEOUL SEMICONDUCTOR CO,. LTD.
=85°C; RH=85%, I
R
V
RH=90%, 24hrs./1cycle
F
T
T
T
T
25°C~65°C~-10°C
T
T
sld
a
a
30min. 30min.
a
Test conditions
sld
=-30°C; I
a
=85°C; RH=85%
=25°C; I
=215±5°C, 3sec.
-30°C ~ 85°C
=85°C; I
(Lead Solder)
=260°C, 10sec.
T
T
a
a
=100°C
=-40°C
Test Condition
- 13/13
I
I
F
F
F
F
F
V
=20mA
=20mA
=20mA
=20mA
=5mA
R
=5V
F
=15mA
L.S.L×0.5
Min.
Criteria for Judgment
-
-
over 95%
20 cycles
1000 hrs.
1000 hrs.
1000 hrs.
1000 hrs.
1000 hrs.
1000 hrs.
10 cycles
2 Times
500 hrs.
100 hrs.
1 Time
Note
U.S.L×1.2
U.S.L×2.0
Max.
Number of
-
Damaged
0/50
0/50
0/20
0/50
0/50
0/20
0/50
0/20
0/20
0/50
0/50
0/50
SSC-SWTS903