cat24c128 Catalyst Semiconductor, cat24c128 Datasheet - Page 2

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cat24c128

Manufacturer Part Number
cat24c128
Description
128-kb I?c Cmos Serial Eeprom
Manufacturer
Catalyst Semiconductor
Datasheet

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ABSOLUTE MAXIMUM RATINGS
RELIABILITY CHARACTERISTICS
D.C. OPERATING CHARACTERISTICS
V
PIN IMPEDANCE CHARACTERISTICS
V
Note:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
(2) The DC input voltage on any pin should not be lower than -0.5 V or higher than V
(3) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100
(4) Page Mode, V
(5) When not driven, the WP pin is pulled down to GND internally. For improved noise immunity, the internal pull-down is relatively strong;
Doc. No. MD-1103, Rev. J
CAT24C128
Storage Temperature
Voltage on Any Pin with Respect to Ground
Symbol Parameter
Symbol Parameter
CC
CC
Symbol
N
V
V
C
C
I
I
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this speci-
fication is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
undershoot to no less than -1.5 V or overshoot to no more than V
and JEDEC test methods.
therefore the external driver must be able to supply the pull-down current when attempting to drive the input HIGH. To conserve power, as
the input level exceeds the trip point of the CMOS input buffer (~ 0.5 x VCC), the strong pull-down reverts to a weak current source.
I
END
T
CCW
V
WP
CCR
I
V
= 1.8 V to 5.5 V, T
= 1.8 V to 5.5 V, T
SB
I
OL1
OL2
IN
IN
DR
L
IH
IL
(3)
(3)
(5)
(4)
Read Current
Write Current
Standby Current
I/O Pin Leakage
Input Low Voltage
Input High Voltage
Output Low Voltage V
Output Low Voltage V
Endurance
Data Retention
Parameter
SDA I/O Pin Capacitance
Input Capacitance (other pins)
WP Input Current
CC
= 5 V, 25°C
A
A
= -40°C to +125°C, unless otherwise specified.
= -40°C to +125°C, unless otherwise specified.
Test Conditions
Read, f
Write, f
All I/O Pins at GND or V
Pin at GND or V
CC
CC
(1)
(3)
< 2.5 V, I
< 2.5 V, I
SCL
SCL
= 400kHz
= 400kHz
(2)
OL
OL
= 3.0mA
= 1.0mA
CC
CC
2
CC
+ 1.5 V, for periods of less than 20 ns.
1,000,000
Conditions
V
V
V
V
T
T
T
T
IN
IN
IN
IN
Min
100
A
A
A
A
= -40°C to +85°C
= -40°C to +125°C
= -40°C to +85°C
= -40°C to +125°C
= 0 V
= 0 V
< V
> V
IH
IH
CC
+ 0.5 V. During transitions, the voltage on any pin may
V
Program/ Erase Cycles
Characteristics subject to change without notice
CC
Min
-0.5
x 0.7 V
Units
Years
-65°C to +150°C
-0.5 V to +6.5 V
Max
© Catalyst Semiconductor, Inc.
V
200
8
6
1
CC
CC
Max
0.4
0.2
1
3
1
2
1
2
x 0.3
+ 0.5
Units
pF
pF
μA
μA
Units
mA
mA
μA
μA
V
V
V
V

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