ispgdx80va Lattice Semiconductor Corp., ispgdx80va Datasheet - Page 9

• Manufacturer Part Number: ispgdx80va
• Description: In-system Programmable 3.3v Generic Digital Crosspoint
• Manufacturer: Lattice Semiconductor Corp.

1. Typical values are at V
Output Load Conditions (See Figure 8)
3-state levels are measured 0.5V from steady-state active level.
V
V
V
V
V
SYMBOL
Switching Test Conditions
DC Electrical Characteristics for 3.3V Range
C
A
B
D
Input Pulse Levels
Input Rise and Fall Time
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
TEST CONDITION
CCIO
IL
IH
OL
OH
Active High
Active Low
Active High to Z
at V -0.5V
Active Low to Z
at V +0.5V
Slow Slew
OH
OL
I/O Reference Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
153Ω
153Ω
153Ω
CC
R1
PARAMETER
∞
∞
∞
= 3.3V and T
3.3V
134Ω
134Ω
134Ω
R2
∞
∞
∞
Over Recommended Operating Conditions
< 1.5ns 10% to 90%
GND to V
156Ω
156Ω
156Ω
R1
A
∞
∞
∞
See Figure 8
= 25°C.
V
V
2.5V
CCIO(MIN)
CCIO(MIN)
Table 2-0004A/gdxva
144Ω
144Ω
144Ω
R2
∞
∞
∞
CCIO(MIN)
/2
/2
35pF
35pF
35pF
35pF
5pF
5pF
CL
V
V
V
V
OH
OH
CC
CC
≤ V
≤ V
= V
= V
9
OUT
OUT
CC (MIN)
CC (MIN)
*
Figure 8. Test Load
Device
Output
C L includes Test Fixture and Probe Capacitance.
CONDITION
Specifications ispGDX80VA
or V
or V
OUT
OUT
–
I
I
I
I
OL
OL
OH
OH
≤ V
≤ V
= +100µA
= +24mA
= -100µA
= -12mA
OL (MAX)
OL(MAX)
V
CCIO
MIN.
-0.3
3.0
2.0
2.8
2.4
R 1
R 2
–
–
TYP.
–
–
–
–
–
–
–
C L
1
*
MAX. UNITS
5.25
0.55
3.6
0.8
0.2
–
–
Table 2-0007/gdxva
Point
Test
0213D
V
V
V
V
V
V
V