CAT24C44 Catalyst Semiconductor, CAT24C44 Datasheet - Page 3

• Manufacturer Part Number: CAT24C44
• Description: 256-Bit Serial Nonvolatile CMOS Static RAM
• Manufacturer: Catalyst Semiconductor

ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................. –55 C to +125 C
Storage Temperature ....................... –65 C to +150 C
Voltage on Any Pin with
V
Package Power Dissipation
Lead Soldering Temperature (10 secs) ............ 300 C
Output Short Circuit Current
CAPACITANCE T
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns.
(3) Output shorted for no more than one second. No more than one output shorted at a time.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
RELIABILITY CHARACTERISTICS
D.C. OPERATING CHARACTERISTICS
V
CC
CC
Symbol
Symbol
Symbol
N
T
V
I
C
C
Maximum DC voltage on output pins is V
LTH
Respect to Ground
Capability (Ta = 25 C) ................................... 1.0W
DR
ZAP
I
I
I
I
V
V
V
V
with Respect to Ground ............... –2.0V to +7.0V
END
I/O
IN
CCO
SB
LI
LO
= 5V 10%, unless otherwise specified.
IH
IL
OH
OL
(1)
(1)
(1)(4)
(1)
(1)
(1)
Current Consumption (Operating)
Current Consumption (Standby)
Input Current
Output Leakage Current
High Level Input Voltage
Low Level Input Voltage
High Level Output Voltage
Low Level Output Voltage
Endurance
Data Retention
ESD Susceptibility
Latch-Up
Parameter
A
Input/Output Capacitance
Input Capacitance
= 25 C, f = 1.0 MHz, V
(2)
Parameter
............. –2.0 to +VCC +2.0V
(3)
Parameter
........................ 100 mA
CC
100,000
+0.5V, which may overshoot to V
2000
Min.
100
10
CC
= 5V
Min.
Max.
2.4
2
0
3
Limits
Typ.
Cycles/Byte
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation
of the device at these or any other conditions outside of
those listed in the operational sections of this specifica-
tion is not implied. Exposure to any absolute maximum
rating for extended periods may affect device perfor-
mance and reliability.
Max.
10
Units
Years
6
Volts
mA
CC
Max.
+2.0V for periods of less than 20 ns.
V
0.8
0.4
30
10
3
2
CC
MIL-STD-883, Test Method 3015
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
JEDEC Standard 17
Unit
mA
Unit
V
V
V
V
pF
pF
A
A
A
Reference Test Method
CC
+1V.
Inputs = 5.5V, T
All Outputs Unloaded
CE = V
0
0
I
I
OH
OL
= 4.2mA
V
V
= –2mA
IN
OUT
Conditions
IL
Conditions
Doc. No. 25019-0A 2/98 N-1
5.5V
V
V
I/O
5.5V
IN
= 0V
= 0V
A
= 0 C