CAT28C16A CATALYST [Catalyst Semiconductor], CAT28C16A Datasheet - Page 3

• Manufacturer Part Number: CAT28C16A
• Description: 16K-Bit CMOS PARALLEL E2PROM
• Manufacturer: CATALYST [Catalyst Semiconductor]

ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................. –55 C to +125 C
Storage Temperature ....................... –65 C to +150 C
Voltage on Any Pin with
V
Package Power Dissipation
Lead Soldering Temperature (10 secs) ............ 300 C
Output Short Circuit Current
RELIABILITY CHARACTERISTICS
D.C. OPERATING CHARACTERISTICS
V
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
(3) Output shorted for no more than one second. No more than one output shorted at a time.
(4) Latch-up protection is provided for stresses up to 100mA on address and data pins from –1V to V
(5) V
(6) V
CC
CC
Symbol
Symbol
N
T
V
I
I
I
I
I
I
I
V
V
V
V
V
LTH
voltage on output pins is V
Respect to Ground
Capability (Ta = 25 C) ................................... 1.0W
CC
CCC
SB
SBC
LI
LO
DR
ZAP
END
with Respect to Ground ............... –2.0V to +7.0V
= 5V 10%, unless otherwise specified.
ILC
IHC
IH
IL
OH
OL
WI
(5)
(6)
(1)
(1)(4)
(6)
= –0.3V to +0.3V.
(1)
(5)
= V
(1)
CC
–0.3V to V
Endurance
Data Retention
ESD Susceptibility
Latch-Up
V
V
V
V
Input Leakage Current
Output Leakage Current
High Level Input Voltage
Low Level Input Voltage
High Level Output Voltage
Low Level Output Voltage
Write Inhibit Voltage
CC
CC
CC
CC
Parameter
Current (Operating, TTL)
Current (Operating, CMOS)
Current (Standby, TTL)
Current (Standby, CMOS)
CC
(2)
+0.3V.
CC
Parameter
........... –2.0V to +V
+0.5V, which may overshoot to V
(3)
........................ 100 mA
10,000
2000
Min.
100
10
CC
+ 2.0V
Min.
–0.3
Max.
–10
–10
2.4
3.0
2
CC
3
+2.0V for periods of less than 20 ns.
Limits
Typ.
Cycles/Byte
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation
of the device at these or any other conditions outside of
those listed in the operational sections of this specifica-
tion is not implied. Exposure to any absolute maximum
rating for extended periods may affect device perfor-
mance and reliability.
Units
Years
Volts
mA
V
CC
Max.
100
0.8
0.4
35
25
10
10
1
+0.3
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 3015
MIL-STD-883, Test Method 1008
JEDEC Standard 17
Units
mA
mA
mA
V
V
V
V
V
A
A
A
CC
+1V.
CE = OE = V
f = 1/t
CE = OE = V
f = 1/t
CE = V
CE = V
All I/O’s Open
V
V
CE = V
I
I
OH
OL
Test Method
IN
OUT
= 2.1mA
= GND to V
= –400 A
Test Conditions
RC
RC
= GND to V
IH
IHC
IH
min, All I/O’s Open
min, All I/O’s Open
, All I/O’s Open
,
IL
ILC
Doc. No. 25033-00 2/98
,
CC
,
CC
,