N74F245D PHILIPS [NXP Semiconductors], N74F245D Datasheet - Page 4

• Manufacturer Part Number: N74F245D
• Description: Octal transceiver 3-State
• Manufacturer: PHILIPS [NXP Semiconductors]

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
Philips Semiconductors
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NOTES:
AC ELECTRICAL CHARACTERISTICS
November 15, 1994
SYMBOL
SYMBOL
V
V
V
V
V
I
I
I
I
I
I
I
I
I
SYMBOL
I
IH
IL
IH
IL
OS
OS
CC
t
t
t
t
t
t
O
OH
OL
OL
IK
PLH
PHL
PZH
PZL
PHZ
PLZ
Octal transceiver (3-State)
+I
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
+I
OZL
OZH
High level output voltage
High-level output voltage
Low-level output voltage
Low-level output voltage
Input clamp voltage
Input current at maximum
input voltage
High-level input current
Low-level input current
Off-state output current
High level voltage applied
Off-state output current
Low level voltage applied
Short circuit output current
Short-circuit output current
Supply current (total)
Output Enable time
to High or Low level
Output Disable time
from High or Low level
Propagation delay
An to Bn, Bn to An
PARAMETER
CC
PARAMETER
PARAMETER
= 5V, T
OS
tests should be performed last.
amb
3
3
= 25 C.
A0 A7 B0 B7
A0–A7, B0–B7
B0 B7
B0–B7
A0 A7
A0–A7
B0–B7
B0–B7
OE, T/R
A0–A7, B0–B7
OE, T/R only
OE, T/R only
A0–A7
B0–B7
I
I
I
CCH
CCL
CCZ
CONDITION
Waveform 1
Waveform 2
Waveform 3
Waveform 2
Waveform 3
TEST
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
CC
IL
IL
IH
CC
CC
IL
IH
CC
IL
IH
CC
CC
CC
CC
CC
CC
CC
CC
CC
CC
= MAX
= MAX,
= MAX,
= MAX,
= MIN
= MIN
= MIN
= MIN,
= MIN
= MIN,
= MIN,
= MIN, I
= 5.5V, V
= 5.5V, V
= MAX, V
= MAX, V
= MAX, V
= MAX, V
= MAX
= MAX
= MAX
MIN
OS
4
, the use of high-speed test apparatus and/or sample-and-hold
TEST CONDITIONS
TEST CONDITIONS
I
= I
I
I
I
I
O
O
= 7.0V
= 5.5V
= 2.7V
= 0.5V
C
MIN
IK
= 2.7V
= 0.5V
2.5
2.5
2.0
3.5
2.5
1.0
I
I
I
I
I
I
I
I
O
OH
O
OH
OL
OL
OL
OL
L
= 50pF, R
T
= 20mA
= 24mA
= MAX
= MAX
= 3mA
= –3mA
= 15mA
= –15mA
V
amb
CC
TYP
= +5.0V
3.5
4.0
4.5
5.5
5.0
3.5
= +25 C
L
= 500
1
1
MAX
10% V
10% V
10% V
10% V
5% V
5% V
5% V
5% V
6.0
6.0
7.0
8.0
6.5
6.0
LIMITS
CC
CC
CC
CC
CC
CC
CC
CC
C
T
V
L
amb
MIN
CC
2.5
2.5
2.0
3.5
2.0
1.0
= 50pF, R
–100
MIN
–60
2.4
2.7
2.0
2.0
= +5.0V
= 0 C to +70 C
LIMITS
–0.73
TYP
0.30
0.35
0.42
L
3.4
60
70
75
= 500
MAX
10%
7.0
7.0
8.0
9.0
7.5
7.0
2
Product specification
MAX
–600
–150
–225
74F245
0.50
0.50
0.55
0.55
–1.2
–1.2
100
100
110
20
70
87
1
UNIT
ns
ns
ns
UNIT
UNIT
mA
mA
mA
mA
mA
mA
mA
V
V
V
V
V
V
V
V
V
A
A
A
A