UAA2080H PHILIPS [NXP Semiconductors], UAA2080H Datasheet - Page 26

• Manufacturer Part Number: UAA2080H
• Description: Advanced pager receiver
• Manufacturer: PHILIPS [NXP Semiconductors]

Philips Semiconductors
Table 6 AC test conditions (notes 1 and 2)
Notes
1. The tests are executed without load on pins TPI and TPQ.
2. All minimum and maximum values correspond to a bit error rate (BER)
3. The BER measurement is started 5 ms (t
1996 Jan 15
SYMBOL
f
t
offset
on
f
a
c
sp
im
bl
Advanced pager receiver
dev
(BER
3
adjacent channel selectivity;
Fig.12(b)
co-channel rejection; Fig.12(b) f
spurious immunity; Fig.12(b)
intermodulation immunity;
Fig.12(c)
blocking immunity; Fig.12(b)
frequency offset range;
Fig.12(a)
deviation range; Fig.12(a)
receiver turn-on time;
Fig.12(a)
100
).
PARAMETER
f
f
f
f
deviation = 4.0 kHz, f
deviation = 2.5 to 7 kHz; ( f
note 3
on(max)
2
2
2
2
2
= f
= f
= 100 kHz to 2 GHz
= f
= f
generator 1: modulated test signal 1
generator 2: modulated test signal 2
generator 1: modulated test signal 1
generator 2: modulated test signal 2
generator 1: modulated test signal 1
generator 2: modulated test signal 2
generator 1: modulated test signal 1
generator 2: unmodulated
generator 3: modulated test signal 2
generator 1: modulated test signal 1
generator 2: modulated test signal 2
generator 1: modulated test signal 1
generator 1: modulated test signal 1
generator 1: modulated test signal 1
1
1
1
1
) after V
up to 3 kHz
1 MHz
f
f
CS
cs
; f
26
3
RE
= f
goes HIGH; BER is then measured for 100 bits
1
CONDITIONS
2 f
1
= f
cs
i(RF)
dev(min)
3
2 kHz (f
100
in the wanted signal (P
to f
offset(min)
dev(max)
)
)
P
P
P
P
P
P
P
P
P
P
P
P
P
P
Product specification
1
2
1
2
1
2
1
2
3
1
2
1
1
1
TEST SIGNALS
= P
= P
= P
= P
= P
= P
= P
= P
= P
= P
= P
= P
= P
= P
UAA2080
2
i(ref)
1
i(ref)
1
i(ref)
1
i(ref)
1
i(ref)
1
i(ref)
i(ref)
i(ref)
1
).
+
+
+
+
+ 3 dB
+ 3 dB
+ 3 dB
+ 3 dB
+ 3 dB
+ 3 dB
+ 3 dB
+ 10 dB
c(max)
a(min)
sp( min)
im(min)
bl(min)