ADUM1100ARWZ AD [Analog Devices], ADUM1100ARWZ Datasheet

ADUM1100ARWZ

Manufacturer Part Number

ADUM1100ARWZ

Description

Manufacturer

AD [Analog Devices]

Datasheet

1.ADUM1100ARWZ.pdf (8 pages)

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One Technology Way • P.O. Box 9106 • Norwood, MA 02062-9106 • Tel: 781/329-4700 • Fax: 781/461-3113 •

INTRODUCTION

Analog Devices iCoupler products offer an alternative iso-

lation solution to optocouplers with superior integration,

performance, and power consumption characteristics. An

iCoupler isolation channel consists of CMOS input and

output circuits and a chip scale transformer (see Figure 1).

Because the iCoupler employs CMOS technology, it can

be more vulnerable to latch-up or electrostatic discharge

(ESD) damage than an optocoupler when subjected to

system-level ESD, surge voltage, fast transient, or other

overvoltage conditions.

This application note provides guidance for avoiding

these problems. Examples are presented for various

system-level test configurations showing mechanisms

that may impact performance. For each example recom-

mended solutions are given.

Later this year, Analog Devices is introducing hardened

versions of most iCoupler products that will have

improved immunity to latch-up and electrical overstress

(EOS). This new product family, the ADuM3xxx series,

will be pin - compatible with the existing ADuM1xxx

series products and will offer identical performance

specifications. Both product families will continue to

be made available.

REV. 0

Figure 1. ADuM140x Quad Isolator

ESD/Latch-Up Considerations with iCoupler

by Rich Ghiorse

Components vs. Systems

Simply put, a component is a single integrated device

with interconnects while a system is a nonintegrated

device built from several interconnected components. In

almost all cases the distinction between a component

and a system is obvious. However, the differences

between component and system tests may not be

so obvious. Further, component specifications may

not directly indicate how a device will perform in

system - level testing. ESD testing is a good example

of this.

ESD, surge, burst, and fast transient events are facts of

life in electronic applications. These events generally

consist of high voltage, short duration spikes applied

directly or indirectly to a device. These events arise

from interaction of the device to real-world phenomena,

such as human contact, ac line perturbations, lightning

strikes, or common-mode voltage differences between

system grounds.

Component-level ESD testing is most useful in deter-

mining a device’s robustness to handling by humans

and automated assembly equipment prior and during

assembly into a system. Component-level ESD data is

less useful in determining a device’s robustness within

a system subjected to system-level ESD events. There

are two reasons for this.

•

System - and component- level ESD testing have

different objectives. Component-level testing seeks

to address conditions typically endured during com-

ponent handling and assembly. System-level testing

seeks to address conditions typically endured during

system operation.

The specific conditions a component is subjected

to during system-level testing can be a strong func-

tion of the board/module/system design in which it

resides. For example, long inductive traces between

a system and component ground can actually impose

a more severe voltage transient onto a component

than is imposed on the system at the test point.

APPLICATION NOTE

Isolation Products

www.analog.com

AN-793

Related parts for ADUM1100ARWZ

ADUM1100ARWZ Summary of contents

Page 1

One Technology Way • P.O. Box 9106 • Norwood, MA 02062-9106 • Tel: 781/329-4700 • Fax: 781/461-3113 • ESD/Latch-Up Considerations with iCoupler INTRODUCTION Analog Devices iCoupler products offer an alternative iso- lation solution to optocouplers with superior integration, performance, and ...

Page 2

AN-793 Table I summarizes the ESD test results for the ADuM140x quad isolator. One might conclude from Table I that iCouplers can only be used in systems with ESD ratings of < 4 kV. In reality it is quite common ...

Page 3

IEC 61000-4-2 ESD Testing A block diagram of the IEC 61000- 4-2 ESD test is shown in Figure 3. In this test, ESD contact or air discharges are applied at various points on a system chassis. This gives rise to ...

Page 4

AN-793 Figure 5 shows an ESD test setup and the paths of cur- rents I and I caused by an ESD strike. These currents ESD 1 can be very large, and induce large magnetic fields on the application printed wiring ...

Page 5

Figure 7. iCoupler in IEC 61000-4-5 SurgeTest Setup Figure 8 shows the model reduced for easier analysis of circuit. The simplified schematic ...

Page 6

... Table III gives examples of the part numbering for the two product families. Table III. Part Numbering Examples for Various Standard and ESD-Hardened iCoupler Products Standard ESD-Hardened Products Products ADuM1100ARWZ ADuM3100ARWZ ADuM1201ARWZ ADuM3201ARWZ ADuM1301BRWZ ADuM3301BRWZ ADuM1402CRWZ ADuM3402CRWZ Inside the ADuM3xxx Series iCoupler ...

Page 7

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Page 8

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