HX6656 ETC1 [List of Unclassifed Manufacturers], HX6656 Datasheet - Page 6

• Manufacturer Part Number: HX6656
• Description: 32K x 8 ROM-SOI
• Manufacturer: ETC1 [List of Unclassifed Manufacturers]

HX6656
READ CYCLE AC TIMING CHARACTERISTICS (1)
TAVAVR
TAVQV
TAXQX
TSLQV
TSLQX
TSHQZ
TEHQV
TEHQX
TELQZ
TGLQV
TGLQX
TGHQZ
(1) Test conditions: input switching levels VIL/VIH=0.5V/VDD-0.5V (CMOS), VIL/VIH=0V/3V (TTL), input rise and fall times <1 ns/V, input and
(2) Typical operating conditions: VDD=5.0 V, TA=25°C, pre-radiation.
(3) Worst case operating conditions: VDD=4.5 V to 5.5 V, -55°C to +125°C, post total dose at 25°C.
(4) Chip Enable (CE) pin not available on 28-lead FP or DIP.
Symbol
output timing reference levels shown in the Tester AC Timing Characteristics table, capacitive output loading C
capacitive output loading C
ADDRESS
NCS
DATA OUT
CE
NOE
Address Read Cycle Time
Address Access Time
Address Change to Output Invalid Time
Chip Select Access Time
Chip Select Output Enable Time
Chip Select Output Disable Time
Chip Enable Access Time (4)
Chip Enable Output Enable Time (4)
Chip Enable Output Disable Time (4)
Output Enable Access Time
Output Enable Output Enable Time
Output Enable Output Disable Time
Parameter
L
=5 pF for TSHQZ, TELQZ TGHQZ. For C
IMPEDANCE
HIGH
T
T
EHQX
EHQV
T
AVQV
T
T
T
T
T
SLQV
SLQX
AVAVR
GLQX
GLQV
6
L
>50 pF, derate access times by 0.02 ns/pF (typical).
DATA VALID
T
AXQX
Typical
(2)
Worst Case (3)
Min
T
25
-55 to 125
T
ELQZ
3
5
5
0
L
SHQZ
T
>50 pF, or equivalent
GHQZ
Max
25
25
10
25
10
°
9
9
C
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns