STM32F372VBT6 STMicroelectronics, STM32F372VBT6 Datasheet - Page 80

• Manufacturer Part Number: STM32F372VBT6
• Description: ARM Microcontrollers - MCU 32-Bit ARM Cortex M4 72MHz 128kB MCU FPU
• Manufacturer: STMicroelectronics

Specifications of STM32F372VBT6

• Product Category: ARM Microcontrollers - MCU
• Rohs: yes
• Core: ARM Cortex M4F
• Processor Series: STM32F372xx
• Data Bus Width: 32 bit
• Maximum Clock Frequency: 72 MHz
• Program Memory Size: 128 KB
• Data Ram Size: 24 KB
• On-chip Adc: Yes
• Operating Supply Voltage: 2.4 V to 3.6 V
• Operating Temperature Range: - 40 C to + 85 C
• Package / Case: LQFP-100
• Mounting Style: SMD/SMT
• A/d Bit Size: 16 bit
• A/d Channels Available: 1
• Interface Type: CAN, I2C, SPI, USART, USB
• Length: 14 mm
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 40 C
• Number Of Programmable I/os: 84
• Number Of Timers: 2
• On-chip Dac: Yes
• Program Memory Type: Flash
• Supply Voltage - Max: 3.6 V
• Supply Voltage - Min: 2.4 V

Electrical characteristics
6.3.13
80/128
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
●
●
These tests are compliant with EIA/JESD 78A IC latch-up standard.
Table 50.
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V
above V
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into the
I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (higher
than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out
of –5 µA/+0 µA range), or other functional failure (for example reset occurrence or oscillator
frequency deviation).
The test results are given in
Symbol
LU
A supply overvoltage is applied to each power supply pin
A current injection is applied to each input, output and configurable I/O pin
DD
(for standard, 3 V-capable I/O pins) should be avoided during normal product
Static latch-up class
Electrical sensitivities
Parameter
Table
Doc ID 022691 Rev 3
T
51.
A
+105 °C conforming to JESD78A
Conditions
STM32F37x
II level A
Class
SS
or