NAND128W3A2BN6E NUMONYX, NAND128W3A2BN6E Datasheet

IC FLASH 128MBIT 48TSOP

NAND128W3A2BN6E

Manufacturer Part Number
NAND128W3A2BN6E
Description
IC FLASH 128MBIT 48TSOP
Manufacturer
NUMONYX
Datasheets

Specifications of NAND128W3A2BN6E

Format - Memory
FLASH
Memory Type
FLASH - Nand
Memory Size
128M (16M x 8)
Interface
Parallel
Voltage - Supply
2.7 V ~ 3.6 V
Operating Temperature
-40°C ~ 85°C
Package / Case
48-TSOP
Access Time
12µs
Supply Voltage Range
2.7V To 3.6V
Memory Case Style
TSOP
No. Of Pins
48
Operating Temperature Range
-40°C To +85°C
Voltage, Vcc
3.3V
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Speed
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
497-5037
497-5037

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FEATURES SUMMARY
July 2004
This is preliminary information on a new product now in development or undergoing evaluation. Details are subject to change without notice.
HIGH DENSITY NAND FLASH MEMORIES
NAND INTERFACE
SUPPLY VOLTAGE
PAGE SIZE
BLOCK SIZE
PAGE READ / PROGRAM
COPY BACK PROGRAM MODE
FAST BLOCK ERASE
STATUS REGISTER
ELECTRONIC SIGNATURE
CHIP ENABLE ‘DON’T CARE’ OPTION
AUTOMATIC PAGE 0 READ AT POWER-UP
OPTION
SERIAL NUMBER OPTION
Up to 1 Gbit memory array
Up to 32 Mbit spare area
Cost effective solutions for mass storage
applications
x8 or x16 bus width
Multiplexed Address/ Data
Pinout compatibility for all densities
1.8V device: V
3.0V device: V
x8 device: (512 + 16 spare) Bytes
x16 device: (256 + 8 spare) Words
x8 device: (16K + 512 spare) Bytes
x16 device: (8K + 256 spare) Words
Random access: 12µs (max)
Sequential access: 50ns (min)
Page program time: 200µs (typ)
Fast page copy without external buffering
Block erase time: 2ms (Typ)
Simple interface with microcontroller
Boot from NAND support
Automatic Memory Download
528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories
DD
DD
= 1.7 to 1.95V
= 2.7 to 3.6V
128 Mbit, 256 Mbit, 512 Mbit, 1 Gbit (x8/x16)
NAND512-A, NAND01G-A
NAND128-A, NAND256-A
Figure 1. Packages
HARDWARE DATA PROTECTION
DATA INTEGRITY
DEVELOPMENT TOOLS
Program/Erase locked during Power
transitions
100,000 Program/Erase cycles
10 years Data Retention
Error Correction Code software and
hardware models
Bad Blocks Management and Wear
Leveling algorithms
PC Demo board with simulation software
File System OS Native reference software
Hardware simulation models
VFBGA55 8 x 10 x 1mm
TFBGA55 8 x 10 x 1.2mm
VFBGA63 8.5 x 15 x 1mm
TFBGA63 8.5 x 15 x 1.2mm
WSOP48 12 x 17 x 0.65mm
TSOP48 12 x 20mm
FBGA
PRELIMINARY DATA
1/56

Related parts for NAND128W3A2BN6E

NAND128W3A2BN6E Summary of contents

Page 1

... Byte/264 Word Page, 1.8V/3V, NAND Flash Memories FEATURES SUMMARY HIGH DENSITY NAND FLASH MEMORIES – Gbit memory array – Mbit spare area – Cost effective solutions for mass storage applications NAND INTERFACE – x16 bus width – Multiplexed Address/ Data – ...

Page 2

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Table 1. Product List Reference NAND128-A NAND256-A NAND512-A NAND01G-A 2/56 Part Number NAND128R3A NAND128W3A NAND1282R4A NAND128W4A NAND256R3A NAND256W3A NAND256R4A NAND256W4A NAND512R3A NAND512W3A NAND512R4A NAND512W4A NAND01GR3A NAND01GW3A NAND01GR4A NAND01GW4A ...

Page 3

... Figure 8. FBGA63 Connections, x8 devices (Top view through package Figure 9. FBGA63 Connections, x16 devices (Top view through package MEMORY ARRAY ORGANIZATION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Bad Blocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Table 4. Valid Blocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Figure 10.Memory Array Organization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 SIGNAL DESCRIPTIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Inputs/Outputs (I/O0-I/O7 Inputs/Outputs (I/O8-I/O15 Address Latch Enable (AL Command Latch Enable (CL Chip Enable (E) ...

Page 4

... Table 8. Address Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 COMMAND SET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Table 9. Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 DEVICE OPERATIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Pointer Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Figure 11.Pointer Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Figure 12.Pointer Operations for Programming Read Memory Array Random Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Page Read Sequential Row Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Figure 13.Read (A,B,C) Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Figure 14.Read Block Diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 Figure 15.Sequential Row Read Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 Figure 16 ...

Page 5

Figure 23.Garbage Collection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ...

Page 6

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Table 25. TFBGA55 8 x 10mm - 6x8 active ball array - 0.80mm pitch, Package Mechanical Data 49 Figure 43.VFBGA63 8.5 x 15mm - 6x8 active ball array, 0.80mm pitch, Package Outline . . . . ...

Page 7

... ST Sales office. For information on how to order these options refer to Table 28., Ordering Information vices are shipped from the factory with Block 0 al- ways valid and the memory content bits, in valid blocks, erased to ’1’. See Table 2., Product vices available in the family. ...

Page 8

... NAND01GW3A NAND01G-A 1Gbit NAND01GR4A x16 NAND01GW4A Figure 2. Logic Diagram NAND Flash 8/56 Page Block Memory Operating Size Size Array Voltage 1.7 to 1.95V 512+16 16K+512 Bytes Bytes 2.7 to 3.6V 32 Pages x 1024 Blocks 1.7 to 1.95V 256+8 8K+256 Words Words 2.7 to 3.6V 1.7 to 1.95V ...

Page 9

... Figure 3. Logic Block Diagram Address Register/Counter Command Interface E Logic WP R Command Register NAND128-A, NAND256-A, NAND512-A, NAND01G-A NAND Flash Memory Array P/E/R Controller, High Voltage Generator Page Buffer Cache Register Y Decoder I/O Buffers & Latches RB I/O0-I/O7, x8/x16 I/O8-I/O15, x16 AI07561b 9/56 ...

Page 10

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Figure 4. TSOP48 and WSOP48 Connections, x8 devices NAND Flash (x8 ...

Page 11

Figure 6. FBGA55 Connections, x8 devices (Top view through package NAND128-A, NAND256-A, NAND512-A, NAND01G ...

Page 12

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Figure 7. FBGA55 Connections, x16 devices (Top view through package 12/ ...

Page 13

Figure 8. FBGA63 Connections, x8 devices (Top view through package NAND128-A, NAND256-A, NAND512-A, NAND01G ...

Page 14

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Figure 9. FBGA63 Connections, x16 devices (Top view through package I/ 14/56 3 ...

Page 15

... MEMORY ARRAY ORGANIZATION The memory array is made up of NAND structures where 16 cells are connected in series. The memory array is organized in blocks where each block contains 32 pages. The array is split into two areas, the main area and the spare area. The main area of the array is used to store data ...

Page 16

... Refer to the teristics value of the pull-up resistor. V Supply Voltage supply to the internal core of the memory device the main power supply for all operations (read, program and erase). An internal voltage detector disables all functions whenever V 1.5V (for 1.8V devices) to protect the device from any involuntary program/erase during power-tran- ) ...

Page 17

... When the Write Protect signal is Low the device will not accept program or erase operations and so the contents of the memory array cannot be al- tered. The Write Protect signal is not latched by Write Enable to ensure protection even during power-up ...

Page 18

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Table 6. Address Insertion, x8 Devices Bus Cycle I/O7 I/ A16 A15 2 rd A24 A23 3 th( Note set Low or High ...

Page 19

COMMAND SET All bus write operations to the device are interpret the Command Interface. The Commands are input on I/O0-I/O7 and are latched on the rising edge of Write Enable when the Command Latch Enable signal is high. ...

Page 20

... Figure 11.) the read command codes (00h, 01h, 50h) are used to act as pointers to the different areas of the memory array (they se- lect the most significant column address). The Read A and Read B commands act as point- ers to the main memory area. Their use depends on the bus width of the device ...

Page 21

... Read Memory Array Each operation to read the memory area starts with a pointer operation as shown in the Operations section. Once the area (main or spare) has been selected using the Read A, Read B or Read C commands four bus cycles (for 512Mb and 1Gb devices) or three bus cycles (for 128Mb ...

Page 22

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Figure 14. Read Block Diagrams Read A Command, X8 Devices Area A (2nd half Page) (1st half Page) A9-A26 (1) A0-A7 Read B Command, X8 Devices Area A (2nd half Page) (1st half Page) A9-A26 (1) ...

Page 23

... Page Program The Page Program operation is the standard oper- ation to program data to the memory array. The main area of the memory array is pro- grammed by page, however partial page program- ming is allowed where any number of bytes (1 to 528) or words (1 to 264) can be programmed. ...

Page 24

... The Copy Back Program operation does not re- quire external memory and so the operation is faster and more efficient because the reading and loading cycles are not required. The operation is particularly useful when a portion of a block is up- dated and the rest of the block needs to be copied to the newly assigned block ...

Page 25

... Interface and Status Register. If the Reset command is issued during any operation, the op- eration will be aborted was a program or erase operation that was aborted, the contents of the memory locations being modified will no longer be valid as the data will be partially programmed or erased. NAND128-A, NAND256-A, NAND512-A, NAND01G-A are required to input the block address ...

Page 26

... P/E/R Con- troller. The Error Bit is set to ’1’ when a program or erase operation has failed to write the correct data to the memory. If the Error Bit is set to ‘0’ the oper- ation has completed successfully. SR5, SR4, SR3, SR2 and SR1 are Reserved. ...

Page 27

Table 11. Status Register Bits Bit Name SR7 Write Protection Program/ Erase/ Read SR6 Controller SR5, SR4, Reserved SR3, SR2, SR1 SR0 Generic Error Read Electronic Signature The device contains a Manufacturer Code and De- vice Code. To read these ...

Page 28

... Enable Don’t Care disabled), the device will automatically enter Sequential Row Read mode (Automatic Memory Download) after the power-up sequence, and start reading Page 0, Page 1, etc., until the last memory location is reached, each new page being accessed after a time t BLBH1 ...

Page 29

... Collection, a Wear-Leveling Algorithm and an Er- ror Correction Code, to extend the number of pro- gram and erase cycles and increase the data retention. To help integrate a NAND memory into an applica- tion ST Microelectronics can provide: A Demo board with NAND simulation software for PCs File System OS Native reference software, which supports the basic commands of file management ...

Page 30

... After several updates it is necessary to remove invalid pages to free some memory space. To free this memory space and allow further pro- gram operations it is recommended to implement a Garbage Collection algorithm Garbage Col- lection software the valid pages are copied into a ...

Page 31

First Level Wear-leveling, new data is programmed to the free blocks that have had the fewest write cycles Second Level Wear-leveling, long-lived data is copied to another block so that the original block can be used for more frequently- changed ...

Page 32

NAND128-A, NAND256-A, NAND512-A, NAND01G-A PROGRAM AND ERASE TIMES AND ENDURANCE CYCLES The Program and Erase times and the number of Program/ Erase cycles per block are shown in ble 14. Table 14. Program, Erase Times and Program Erase Endurance Cycles ...

Page 33

DC AND AC PARAMETERS This section summarizes the operating and mea- surement conditions, and the DC and AC charac- teristics of the device. The parameters in the DC and AC characteristics Tables that follow, are de- rived from tests performed ...

Page 34

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Table 18. DC Characteristics, 1.8V Devices Symbol Parameter I DD1 Operating I Current DD2 I DD3 Stand-By Current (CMOS) 128Mb, 256Mb, 512Mb devices I DD5 Stand-By Current (CMOS) 512Mb and 1Gb Dual Die devices I Input ...

Page 35

Table 19. DC Characteristics, 3V Devices Symbol Parameter I DD1 Operating I Current DD2 I DD3 Stand-by Current (TTL), 128Mb, 256Mb, 512Mb devices I DD4 Stand-by Current (TTL) 512Mb and 1Gb Dual Die devices Stand-By Current (CMOS) 128Mb, 256Mb, 512Mb ...

Page 36

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Table 20. AC Characteristics for Command, Address, Data Input Alt. Symbol Symbol t Address Latch Low to Write Enable Low ALLWL t ALS t Address Latch High to Write Enable Low ALHWL t Command Latch High ...

Page 37

Table 21. AC Characteristics for Operations Alt. Symbol Symbol t ALLRL1 Address Latch Low Read Enable Low t ALLRL2 t t Ready/Busy High to Read Enable Low BHRL RR t BLBH1 Ready/Busy Low Ready/Busy ...

Page 38

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Figure 25. Command Latch AC Waveforms CL tCLHWL (CL Setup time) tELWL (E Setup time tALLWL (ALSetup time) AL I/O Figure 26. Address Latch AC Waveforms CL tELWL (E Setup time) E tWLWH W ...

Page 39

Figure 27. Data Input Latch AC Waveforms CL E tALLWL (ALSetup time) AL tWLWH W (Data Setup time) I/O Figure 28. Sequential Data Output after Read AC Waveforms E R tRLQV (R Accesstime) I/O tBHRL RB Note ...

Page 40

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Figure 29. Read Status Register AC Waveform CL tCLHWL E tELWL W R (Data Setup time) I/O Figure 30. Read Electronic Signature AC Waveform I/O 90h Read Electronic Signature Command Note: ...

Page 41

Figure 31. Page Read A/ Read B Operation AC Waveform CL E tWLWL 00h or Add.N I/O 01h cycle 1 Command Code Note: Address cycle 4 is only required for 512Mb and 1Gb devices. NAND128-A, NAND256-A, ...

Page 42

... Figure 32. Read C Operation, One Page AC Waveform Add. M I/O 50h cycle 1 RB Command Code Note: 1. A0-A7 is the address in the Spare Memory area, where A0-A3 are valid and A4-A7 are ‘don’t care’. 42/56 tWHALL Add. M Add. M Add. M cycle 2 cycle 3 cycle 4 Address M Input Busy tWHBH tALLRL2 ...

Page 43

Figure 33. Page Program AC Waveform CL E tWLWL (Write Cycle time Add.N I/O 80h cycle 1 RB Page Program Setup Code Note: Address cycle 4 is only required for 512Mb and 1Gb devices. NAND128-A, NAND256-A, NAND512-A, ...

Page 44

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Figure 34. Block Erase AC Waveform CL E tWLWL (Write Cycle time Add. I/O 60h cycle 1 RB Block Erase Setup Command Note: Address cycle 3 is required for 512Mb and 1Gb devices ...

Page 45

Ready/Busy Signal Electrical Characteristics Figures 37, 36 and 38 show the electrical charac- teristics for the Ready/Busy signal. The value re- quired for the resistor R can be calculated using P the following equation: – V DDmax V OLmax R ...

Page 46

NAND128-A, NAND256-A, NAND512-A, NAND01G-A PACKAGE MECHANICAL Figure 39. TSOP48 - 48 lead Plastic Thin Small Outline 20mm, Package Outline DIE Note: Drawing is not to scale. Table 22. TSOP48 - 48 lead Plastic Thin Small ...

Page 47

Figure 40. WSOP48 – 48 lead Plastic Very Very Thin Small Outline 17mm, Package Outline DIE Note: Drawing not to scale. Table 23. WSOP48 lead Plastic Very Very Thin Small Outline ...

Page 48

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Figure 41. VFBGA55 8 x 10mm - 6x8 active ball array, 0.80mm pitch, Package Outline FE Note: Drawing is not to scale Table 24. VFBGA55 8 x 10mm - 6x8 active ball array, 0.80mm pitch, Package ...

Page 49

Figure 42. TFBGA55 8 x 10mm - 6x8 active ball array - 0.80mm pitch, Package Outline SE FE Note: Drawing is not to scale Table 25. TFBGA55 8 x 10mm - 6x8 active ball array - 0.80mm pitch, Package Mechanical ...

Page 50

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Figure 43. VFBGA63 8.5 x 15mm - 6x8 active ball array, 0.80mm pitch, Package Outline E E2 Note: Drawing is not to scale. Table 26. VFBGA63 8.5 x 15mm - 6x8 active ball array, 0.80mm pitch, ...

Page 51

Figure 44. TFBGA63 8.5 x 15mm - 6x8 active ball array, 0.80mm pitch, Package Outline FD1 BALL "A1" Note: Drawing is not to scale Table 27. TFBGA63 8.5 x 15mm - 6x8 active ball array, 0.80mm pitch, ...

Page 52

... E = Lead Free Package, Standard Packing F = Lead Free Package, Tape & Reel Packing Devices are shipped from the factory with the memory content bits, in valid blocks, erased to ’1’. For further information on any aspect of this device, please contact your nearest ST Sales Office. ...

Page 53

... The structure uses the microcontroller DMA (Direct Memory Access) en- gines to optimize the transfer between the NAND Flash and the system RAM. ...

Page 54

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Figure 46. Connection to Microcontroller, With Glue Logic G W CSn A3 Microcontroller Figure 47. Building Storage Modules NAND Flash NAND Flash W Device 54/56 ...

Page 55

RELATED DOCUMENTATION STMicroelectronics has published a set of application notes to support the NAND Flash memories. They are available from the ST Website www.st.com . or from your local ST Distributor. REVISION HISTORY Table 29. Document Revision History Date Version ...

Page 56

NAND128-A, NAND256-A, NAND512-A, NAND01G-A Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may ...

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