CY14B256L-SZ35XC Cypress Semiconductor Corp, CY14B256L-SZ35XC Datasheet - Page 10

IC NVSRAM 256KBIT 35NS 32SOIC

CY14B256L-SZ35XC

Manufacturer Part Number
CY14B256L-SZ35XC
Description
IC NVSRAM 256KBIT 35NS 32SOIC
Manufacturer
Cypress Semiconductor Corp
Type
NVSRAMr
Datasheets

Specifications of CY14B256L-SZ35XC

Format - Memory
RAM
Memory Type
NVSRAM (Non-Volatile SRAM)
Memory Size
256K (32K x 8)
Speed
35ns
Interface
Parallel
Voltage - Supply
2.7 V ~ 3.6 V
Operating Temperature
0°C ~ 70°C
Package / Case
32-SOIC (7.5mm Width)
Word Size
8b
Organization
32Kx8
Density
256Kb
Interface Type
Parallel
Access Time (max)
35ns
Operating Supply Voltage (typ)
3.3V
Package Type
SOIC
Operating Temperature Classification
Commercial
Operating Supply Voltage (max)
3.6V
Operating Supply Voltage (min)
2.7V
Operating Temp Range
0C to 70C
Pin Count
32
Mounting
Surface Mount
Supply Current
55mA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
428-2032-5
CY14B256L-SZ35XC

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
CY14B256L-SZ35XC
Manufacturer:
CYPRESS/赛普拉斯
Quantity:
20 000
Part Number:
CY14B256L-SZ35XCT
Manufacturer:
CYPRESS
Quantity:
5 554
Data Retention and Endurance
Capacitance
Thermal Resistance
AC Test Conditions
Input Pulse Levels .................................................. 0 V to 3 V
Input Rise and Fall Times (10% - 90%)........................ <3 ns
Input and Output Timing Reference Levels ................... 1.5 V
Note
DATA
NV
C
C
10. These parameters are guaranteed by design and are not tested.
Document Number: 001-54707 Rev. *F
IN
OUT
Parameter
C
Parameter
Parameter
R
OUTPUT
Θ
Θ
JC
JA
3.0 V
[10]
[10]
Input capacitance
Output capacitance
30 pF
Data retention
Nonvolatile STORE operations
Thermal resistance
(Junction to ambient)
Thermal resistance
(Junction to case)
Description
Description
577 Ω
R1
789 Ω
Figure 4. AC Test Loads
T
V
Test conditions follow standard
test methods and procedures for
measuring thermal impedance, in
accordance with EIA/JESD51.
Description
A
R2
CC
= 25 °C, f = 1 MHz,
= V
CC
Test Conditions
(Typ)
OUTPUT
Test Conditions
3.0 V
5 pF
48-SSOP 44-TSOP II
37.47
24.71
577 Ω
R1
31.11
5.56
1,000
Min
Max
20
7
7
For tristate specs
CY14B256LA
789 Ω
32-SOIC
R2
41.55
24.43
Page 10 of 22
Years
Unit
Unit
pF
pF
K
°C/W
°C/W
Unit
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