EVAL-AD7864-3CB Analog Devices Inc, EVAL-AD7864-3CB Datasheet - Page 22

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EVAL-AD7864-3CB

Manufacturer Part Number
EVAL-AD7864-3CB
Description
BOARD EVAL FOR AD7864-3
Manufacturer
Analog Devices Inc
Datasheet

Specifications of EVAL-AD7864-3CB

Rohs Status
RoHS non-compliant
Number Of Adc's
1
Number Of Bits
12
Sampling Rate (per Second)
520k
Data Interface
Parallel
Inputs Per Adc
4 Differential
Input Range
±2.5 V
Power (typ) @ Conditions
90mW @ 520kSPS
Voltage Supply Source
Analog and Digital
Operating Temperature
-40°C ~ 85°C
Utilized Ic / Part
AD7864-3
AD7864
terms include (fa + fb) and (fa − fb), whereas the third-order
terms include (2fa + fb), (2fa − fb), (fa + 2fb), and (fa − 2fb).
Using the CCIF standard where two input frequencies near the
top end of the input bandwidth are used, the second- and third-
order terms are of different significance. The second-order
terms are usually distanced in frequency from the original sine
waves, whereas the third-order terms are usually at a frequency
close to the input frequencies. As a result, the second- and
third-order terms are specified separately. The calculation of the
intermodulation distortion is as per the THD specification
where it is the ratio of the rms sum of the individual distortion
products to the rms amplitude of the fundamental expressed in
decibels. In this case, the input consists of two, equal amplitude,
low distortion sine waves. Figure 19 shows a typical IMD plot
for the AD7864.
AC LINEARITY PLOTS
The plots shown in Figure 20 and Figure 21 show typical DNL
and INL plots for the AD7864.
–100
–10
–20
–30
–40
–50
–60
–70
–80
–90
–1
–2
–3
3
2
1
0
0
0
0
AD7864-1 @ 25°C
5V SUPPLY
SAMPLING AT 131072Hz
INPUT FREQUENCY OF
48,928Hz AND 50,016Hz
4096 SAMPLES TAKEN
500
10
1000
Figure 20. Typical DNL Plot
20
Figure 19. IMD Plot
1500
FREQUENCY (kHz)
ADC CODE
30
2000
2500
40
3000
50
3500
60
4000
Rev. D | Page 22 of 28
MEASURING APERTURE JITTER
A convenient way to measure aperture jitter is to use the
relationship it is known to have with SNR (signal-to-noise plus
distortion) given as follows:
where:
SNR
σ is the rms time jitter.
f
Equation 3 demonstrates that the signal-to-noise ratio due to
jitter degrades significantly with frequency. At low input fre-
quencies, the measured SNR performance of the AD7864 is
indicative of noise performance due to quantization noise and
system noise only (72 dB used as a typical figure in this example).
Therefore, by measuring the overall SNR performance
(including noise due to jitter, system, and quantization) of the
AD7864, a good estimation of the jitter performance of the
AD7864 can be calculated.
IN
is the sinusoidal input frequency (1 MHz in this case).
JITTER
SNR
–0.5
–1.0
–1.5
–2.0
–2.5
12
11
10
2.5
2.0
1.5
1.0
0.5
900k
9
8
7
6
5
0
0
is the signal-to-noise due to the rms time jitter.
JITTER
500
Figure 22. ENOB of the AD7864 at 1 MHz
=
20
950k
1000
×
Figure 21. Typical INL Plot
log
10
FREQUENCY (Hz)
1500
(
ADC CODE
2
1.00M
×
2000
π
×
1
f
2500
IN
×
σ
1.05M
)
3000
3500
1.10M
4000
(3)

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