MCP4728EV Microchip Technology, MCP4728EV Datasheet - Page 49

• Manufacturer Part Number: MCP4728EV
• Description: BOARD EVAL 12BIT 4CH DAC MCP4728
• Manufacturer: Microchip Technology
• Type: D/Ar

Specifications of MCP4728EV

• Number Of Dac's: 4
• Number Of Bits: 12
• Outputs And Type: 1, Single Ended
• Data Interface: I²C
• Settling Time: 6µs
• Dac Type: Voltage
• Voltage Supply Source: Single
• Operating Temperature: -40°C ~ 125°C
• Utilized Ic / Part: MCP4728
• Product: Data Conversion Development Tools
• Resolution: 12 bit
• Interface Type: I2C
• Supply Voltage (max): 5.5 V
• Supply Voltage (min): 2.7 V
• Silicon Manufacturer: Microchip
• Silicon Core Number: MCP4728
• Kit Application Type: Data Converter
• Application Sub Type: DAC
• Kit Contents: Board
• For Use With/related Products: MCP4728
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant

6.9
Offset error drift is the variation in offset error due to a
change in ambient temperature. The offset error drift is
typically expressed in ppm/
6.10
The Settling time is the time delay required for the DAC
output to settle to its new output value from the start of
code transition, within specified accuracy. In the
MCP4728 device, the settling time is a measure of the
time delay until the DAC output reaches its final value
within 0.5 LSB when the DAC code changes from 400h
to C00h.
6.11
Major-code transition glitch is the impulse energy
injected into the DAC analog output when the code in
the DAC register changes state. It is normally specified
as the area of the glitch in nV-Sec. and is measured
when the digital code is changed by 1 LSB at the major
carry transition (Example: 011...111 to 100...
000, or 100... 000 to 011... 111).
6.12
Digital feedthrough is a glitch that appears at the
analog output caused by coupling from the digital input
pins of the device. The area of the glitch is expressed
in nV-Sec, and is measured with a full scale change
(Example: all 0s to all 1s and vice versa) on the digital
input pins. The digital feedthrough is measured when
the DAC is not being written to the output register. This
condition can be created by writing the input register
with both the UDAC bit and the LDAC pin high.
© 2010 Microchip Technology Inc.
Offset Error Drift
Settling Time
Major-Code Transition Glitch
Digital Feedthrough
o
C.
6.13
Analog crosstalk is a glitch that appears at the output of
one DAC due to a change in the output of the other
DAC. The area of the glitch is expressed in nV-Sec,
and measured by loading one of the input registers with
a full scale code change (all 0s to all 1s and vice versa)
while keeping both the UDAC bit and the LDAC pin
high. Then bring down the LDAC pin to low and mea-
sure the output of the DAC whose digital code was not
changed.
6.14
DAC-to-DAC crosstalk is the glitch that appears at the
output of one DAC due to an input code change and
subsequent output change of the other DAC. This
includes both digital and analog crosstalks. The area of
the glitch is expressed in nV-Sec, and measured by
loading one of the input registers with a full scale code
change (all 0s to all 1s and vice versa) while keeping
UDAC bit or LDAC pin low.
6.15
PSRR indicates how the output of the DAC is affected
by changes in the supply voltage. PSRR is the ratio of
the change in V
output of the DAC. It is measured on one DAC that is
using an internal V
and expressed in dB or µV/V.
Analog Crosstalk
DAC-to-DAC Crosstalk
Power-Supply Rejection Ratio
(PSRR)
OUT
REF
to a change in V
while the V
MCP4728
DD
DS22187E-page 49
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is varied ±10%,
for full scale