TLP595G Toshiba, TLP595G Datasheet - Page 64

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TLP595G

Manufacturer Part Number
TLP595G
Description
PHOTOCOUPLER RELAY SSR 6-DIP
Manufacturer
Toshiba
Series
TLP595Gr
Datasheets

Specifications of TLP595G

Circuit
SPST-NO (1 Form A)
Output Type
AC, DC
On-state Resistance
12 Ohm
Load Current
150mA
Voltage - Input
1.4VDC
Voltage - Load
0 ~ 400 V
Mounting Type
Through Hole
Termination Style
PC Pin
Package / Case
6-DIP (0.300", 7.62mm)
Input Type
DC
Input Voltage (max)
1.7V
Output Voltage (max)
400V
Input Current (max)
30mA
Output Current
150mA
Isolation Voltage
2.5kV
Circuit Arrangement
1 Form B
Package Type
PDIP
Output Device
MOSFET
Pin Count
5
Mounting
Through Hole
Operating Temp Range
-20C to 85C
Operating Temperature Classification
Commercial
Rad Hardened
No
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant

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Manufacturer
Quantity
Price
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9
For example, let's calculate the operating life of the GaAs LED, based on the data shown on page 60.
Here is an example of how to read an operating life, assuming that the ambient temperature (Ta) is 40°C and that the failure
criterion is a 30% decrease in light output.
Suppose that the initial LED current, IF, is 20 mA. Since the horizontal axis of the failure criteria graph is the reciprocal of absolute
temperature, it is necessary to convert the ambient temperature (Ta) to the reciprocal of absolute temperature (T):
The graph shows the projected lifetimes for F50% and F0.1% cumulative failure probabilities in solid and dashed lines respectively.
Normally, it is recommended to use F0.1% lines.
As X = 3.19, its intersection with the IF = 20 mA line for F0.1% is approximately 80,000 hours. (This figure is for reference only.)
You can also estimate the projected operating life from the projected light output degradation data.
Reading the Projected LED Operating Life Graph
Device Degradation
T =
Ta + 273.15
1
=
10000000
1000000
100000
40 + 273.15
80000
10000
1000
140
120
100
100
80
70
60
40
20
0
227
2.0
1
1
–30%
I
I
I
I
I
F
F
F
F
F
150
Failure criteria for light output degradation Δ P O < –30%
= 10mA
= 20mA
= 30mA
= 40mA
= 50mA
10
3.19 × 10
100 85
Test conditions: I
3.0
60
3.19
100
−3
40
Test time (h)
64
F
25
= 20 mA, Ta = 40°C
1000
0
4.0
I
I
I
I
I
−20
F
F
F
F
F
= 10mA
= 20mA
= 30mA
= 40mA
= 50mA
Projected F50%
operating life
Projected F0.1%
operating life
Ambient Temperature (°C)
10000
X-3σ
−50
1/K(×10
X
80000
100000
−73
5.0
–3
)

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