AT91SAM7L64-AU Atmel, AT91SAM7L64-AU Datasheet - Page 51
![MCU ARM7 64K HS FLASH 128-LQFP](/photos/6/71/67112/128-lqfp_sml.jpg)
AT91SAM7L64-AU
Manufacturer Part Number
AT91SAM7L64-AU
Description
MCU ARM7 64K HS FLASH 128-LQFP
Manufacturer
Atmel
Series
AT91SAMr
Specifications of AT91SAM7L64-AU
Core Processor
ARM7
Core Size
16/32-Bit
Speed
36MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, LCD, POR, PWM, WDT
Number Of I /o
80
Program Memory Size
64KB (64K x 8)
Program Memory Type
FLASH
Ram Size
6K x 8
Voltage - Supply (vcc/vdd)
1.55 V ~ 1.8 V
Data Converters
A/D 4x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
128-LQFP
Controller Family/series
AT91SAM7xxx
No. Of I/o's
80
Ram Memory Size
6KB
Cpu Speed
36MHz
No. Of Timers
1
Rohs Compliant
Yes
Processor Series
AT91SAMx
Core
ARM7TDMI
Data Bus Width
32 bit
Data Ram Size
6 KB
Interface Type
2-Wire, SPI, USART
Maximum Clock Frequency
36 MHz
Number Of Programmable I/os
80
Number Of Timers
3
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
JTRACE-ARM-2M, MDK-ARM, RL-ARM, ULINK2
Development Tools By Supplier
AT91SAM-ICE, AT91-ISP, AT91SAM7L-EK
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 4 Channel
For Use With
AT91SAM7L-STK - KIT EVAL FOR AT91SAM7LAT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Details
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
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- Download datasheet (9Mb)
12. Debug and Test Features
12.1
12.2
6257A–ATARM–20-Feb-08
Overview
Block Diagram
The AT91SAM7L Series Microcontrollers feature a number of complementary debug and test
capabilities. A common JTAG/ICE (Embedded ICE) port is used for standard debugging func-
tions, such as downloading code and single-stepping through programs. The Debug Unit
provides a two-pin UART that can be used to upload an application into internal SRAM. It man-
ages the interrupt handling of the internal COMMTX and COMMRX signals that trace the activity
of the Debug Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
Figure 12-1. Debug and Test Block Diagram
PDC
Boundary
ARM7TDMI
TAP
DBGU
ICE
ICE/JTAG
TAP
AT91SAM7L128/64 Preliminary
Reset
Test
and
POR
JTAGSEL
TDO
TMS
TCK
TDI
DTXD
DRXD
TST
51
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