MC9S08QE32CFT Freescale Semiconductor, MC9S08QE32CFT Datasheet - Page 20

MCU 8BIT 32K FLASH 48-QFN

MC9S08QE32CFT

Manufacturer Part Number
MC9S08QE32CFT
Description
MCU 8BIT 32K FLASH 48-QFN
Manufacturer
Freescale Semiconductor
Series
HCS08r
Datasheets

Specifications of MC9S08QE32CFT

Core Processor
HCS08
Core Size
8-Bit
Speed
50MHz
Connectivity
I²C, LIN, SCI, SPI
Peripherals
LVD, PWM, WDT
Number Of I /o
38
Program Memory Size
32KB (32K x 8)
Program Memory Type
FLASH
Ram Size
2K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 3.6 V
Data Converters
A/D 10x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
48-QFN
Cpu Family
HCS08
Device Core Size
8b
Interface Type
SCI/SPI
# I/os (max)
40
Operating Supply Voltage (typ)
3.3V
Operating Supply Voltage (max)
3.6V
Operating Supply Voltage (min)
2V
On-chip Adc
10-chx12-bit
Instruction Set Architecture
CISC
Operating Temp Range
-40C to 85C
Operating Temperature Classification
Industrial
Mounting
Surface Mount
Pin Count
48
Package Type
QFN EP
Processor Series
S08QE
Core
HCS08
Data Bus Width
8 bit
Data Ram Size
2 KB
Number Of Programmable I/os
40
Operating Supply Voltage
- 0.3 V to + 3.8 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWS08
Development Tools By Supplier
DEMOQE128, EVBQE128
Minimum Operating Temperature
- 40 C
For Use With
DEMO9S08QE32 - DEMO FOR S08 AND QE32/16DC9S08QE32 - DAUGHTER CARD FOR DEMO9S
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Compliant
Electrical Characteristics
3.10
This section describes timing characteristics for each peripheral system.
3.10.1
20
1
2
3
4
Num
Num
10
11
8
9
Data in Typical column is characterized at 3.0 V, 25 °C or is typical recommended value.
The resulting bus clock frequency must not exceed the maximum specified bus clock frequency of the device.
This specification applies to any time the FLL reference source or reference divider is changed, trim value changed or
changing from FLL disabled (FBELP, FBILP) to FLL enabled (FEI, FEE, FBE, FBI). If a crystal/resonator is being used as
the reference, this specification assumes it is already running.
Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum f
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise
injected into the FLL circuitry via V
for a given interval.
1
2
3
4
5
6
7
Table 11. ICS Frequency Specifications (Temperature Range = –40 to 85°C Ambient) (continued)
C
C
C
C FLL acquisition time
C
C
D
D
D
D
D
D
D
AC Characteristics
Total deviation of trimmed DCO output frequency over voltage
and temperature
Total deviation of trimmed DCO output frequency over fixed
voltage and temperature range of 0
Long term jitter of DCO output clock (averaged over 2-ms
interval)
Control Timing
Bus frequency (t
Internal low power oscillator period
External reset pulse width
Reset low drive
BKGD/MS setup time after issuing background debug
force reset to enter user or BDM modes
BKGD/MS hold time after issuing background debug
force reset to enter user or BDM modes
IRQ pulse width
4
cyc
3
= 1/f
Characteristic
DD
Rating
Bus
MC9S08QE32 Series MCU Data Sheet, Rev. 6
2
and V
)
SS
Table 12. Control Timing
°
Asynchronous path
C to 70
and variation in crystal oscillator frequency increase the C
Synchronous path
2.1<V
3
V
°
V
DD
C
DD
DD
> 2.4Vs
≤ 2.1V
≤ 2.4V
2
4
t
Symbol
ILIH,
t
t
t
MSSU
t
t
rstdrv
f
extrst
MSH
LPO
Bus
t
IHIL
Symbol
t
Δf
Δf
Acquire
C
dco_t
dco_t
Jitter
1.5 × t
34 × t
Min
700
100
500
100
100
DC
cyc
cyc
Min
Typical
Typical
–1.0
±0.5
0.02
Freescale Semiconductor
0.5
1
1
Jitter
25.165
Max
1300
Max
0.2
±2
±1
10
20
1
percentage
Bus
%f
%f
%f
Unit
.
ms
Unit
MHz
μs
ns
ns
ns
μs
ns
dco
dco
dco

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