STR750FV1T6 STMicroelectronics, STR750FV1T6 Datasheet - Page 50

• Manufacturer Part Number: STR750FV1T6
• Description: MCU 32BIT 128KB FLASH 100-LQFP
• Manufacturer: STMicroelectronics
• Series: STR7r

Specifications of STR750FV1T6

• Core Processor: ARM7
• Core Size: 32-Bit
• Speed: 60MHz
• Connectivity: CAN, I²C, SPI, SSI, SSP, UART/USART, USB
• Peripherals: DMA, PWM, WDT
• Number Of I /o: 72
• Program Memory Size: 128KB (128K x 8)
• Program Memory Type: FLASH
• Ram Size: 16K x 8
• Voltage - Supply (vcc/vdd): 3 V ~ 5.5 V
• Data Converters: A/D 16x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 100-LQFP
• Processor Series: STR750x
• Core: ARM7TDMI
• Data Bus Width: 32 bit
• Data Ram Size: 16 KB
• Interface Type: CAN, I2C, SPI, SSI, SSP, USB
• Maximum Clock Frequency: 60 MHz
• Number Of Programmable I/os: 72
• Number Of Timers: 6
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWARM, EWARM-BL, KSDK-STR750-PLUS, MCBSTR750, MCBSTR750U, MCBSTR750UME, MDK-ARM, RL-ARM, ULINK2
• Development Tools By Supplier: STR750-MCKIT, STR750-SK/HIT, STR750-SK/IAR, STR750-SK/KEIL, STR750-SK/RAIS, STR750-EVAL, STX-PRO/RAIS, STX-RLINK, STR79-RVDK/CPP, STR79-RVDK, STR79-RVDK/UPG
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit, 16 Channel
• For Use With: MCBSTR750UME - BOARD EVAL MCBSTR750 + ULINK-MEMCBSTR750U - BOARD EVAL MCBSTR750 + ULINK2497-5988 - BOARD DEVELOPMENT LOVE STR750497-5754 - KIT STARTER IAR STR750497-5753 - KIT STARTER KEIL FOR STR7/STR9497-5752 - KIT STARTER IAR FOR STR7/STR9497-5751 - KIT STARTER HITEX FOR STR750497-5748 - BOARD EVALUATION FOR STR750XF497-5046 - KIT TOOL FOR ST7/UPSD/STR7 MCU
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Details
• Other names: 497-5750

Electrical parameters
6.3.6
50/84
Memory characteristics
Flash memory
Subject to general operating conditions for V
otherwise specified.
Table 26.
1. Data based on characterisation not tested in production
2. 10K program/erase cycles.
Table 27.
1. Data based on characterisation not tested in production.
N
N
Symbol
Symbol
END_B0
END_B1
Y
t
t
t
t
t
t
t
t
PDW
t
t
t
t
RPD
ESR
PB0
PB1
PSL
ESL
PW
RET
ES
ES
ES
ES
Word Program
Double Word Program
Bank 0 Program (256K)
Bank 1 Program (16K)
Sector Erase (64K)
Sector Erase (8K)
Bank 0 Erase (256K)
Bank 1 Erase (16K)
Recovery when disabled
Program Suspend Latency
Erase Suspend Latency
Endurance (Bank 0 sectors)
Endurance (Bank 1 sectors)
Data Retention
Erase Suspend Rate
Flash memory characteristics
Flash memory endurance and data retention
Parameter
Parameter
T
Min time from Erase
Resume to next Erase
Suspend
Single Word programming of
a checker-board pattern
Single Word programming of
a checker-board pattern
Not preprogrammed (all 1)
Preprogrammed (all 0)
Not preprogrammed (all 1)
Preprogrammed (all 0)
Not preprogrammed (all 1)
Preprogrammed (all 0)
Not preprogrammed (all 1)
Preprogrammed (all 0)
A
=85° C
STR750Fxx STR751Fxx STR752Fxx STR755Fxx
Conditions
Test Conditions
DD_IO
and V
18
, T
Min
A
100
10
20
20
= -40 to 105 °C unless
(1)
1.176
Typ
1.54
125
392
343
Value
8.0
6.6
0.9
0.8
35
60
2
Typ
Value
Max
2.94
2.38
224
560
532
4.9
13.7
11.2
300
Max
1.5
1.3
20
10
(2)
(2)
(2)
(2)
(1)
(2)
(2)
kcycles
kcycles
Years
Unit
Unit
ms
ms
μs
μs
μs
μs
μs
ms
s
s
s
s