MCF52223CAF80 Freescale Semiconductor, MCF52223CAF80 Datasheet - Page 32

• Manufacturer Part Number: MCF52223CAF80
• Description: IC MCU 256K FLASH 80MHZ 100-LQFP
• Manufacturer: Freescale Semiconductor
• Series: MCF5222xr

Specifications of MCF52223CAF80

• Core Processor: Coldfire V2
• Core Size: 32-Bit
• Speed: 80MHz
• Connectivity: I²C, SPI, UART/USART, USB OTG
• Peripherals: DMA, LVD, POR, PWM, WDT
• Number Of I /o: 56
• Program Memory Size: 256KB (256K x 8)
• Program Memory Type: FLASH
• Ram Size: 32K x 8
• Voltage - Supply (vcc/vdd): 3 V ~ 3.6 V
• Data Converters: A/D 8x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 100-LQFP
• Processor Series: MCF522x
• Core: ColdFire V2
• Data Bus Width: 32 bit
• Data Ram Size: 32 KB
• Interface Type: I2C/QSPI/UART/USB
• Maximum Clock Frequency: 80 MHz
• Number Of Programmable I/os: 56
• Number Of Timers: 10
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: JLINK-CF-BDM26, EWCF
• Development Tools By Supplier: M52221DEMO, M52223EVB
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 8-ch x 12-bit
• For Use With: M52223EVB - BOARD EVAL FOR MCF52223
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

2.5
2.6
Freescale Semiconductor
Name
EP1a
EP1
EP2
EP3
EP4
EP5
EP6
EP7
EP8
EP9
EzPort Electrical Specifications
ESD Protection
EPCK frequency of operation (all commands except READ)
EPCK frequency of operation (READ command)
EPCS_b negation to next EPCS_b assertion
EPCS_B input valid to EPCK high (setup)
EPCK high to EPCS_B input invalid (hold)
EPD input valid to EPCK high (setup)
EPCK high to EPD input invalid (hold)
EPCK low to EPQ output valid (out setup)
EPCK low to EPQ output invalid (out hold)
EPCS_B negation to EPQ tri-state
1
2
Characteristics
ESD target for Human Body Model
ESD target for Machine Model
HBM circuit description
MM circuit description
Number of pulses per pin (HBM)
Number of pulses per pin (MM)
Interval of pulses
• Positive pulses
• Negative pulses
• Positive pulses
• Negative pulses
All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for
Automotive Grade Integrated Circuits.
A device is defined as a failure if after exposure to ESD pulses the device no longer
meets the device specification requirements. Complete DC parametric and functional
testing is performed per applicable device specification at room temperature followed by
hot temperature, unless specified otherwise in the device specification.
Table 28. ESD Protection Characteristics
Table 27. EzPort Electrical Specifications
MCF52223 ColdFire Microcontroller, Rev. 3
Characteristic
Symbol
R
R
HBM
MM
series
series
—
—
—
—
—
C
C
Value
2000
1500
200
100
200
0
1
1
3
3
1
1, 2
2 × T
Min
—
—
—
—
5
5
2
5
0
Units
cyc
sec
pF
pF
—
—


V
V
Electrical Characteristics
f
f
sys
sys
Max
12
12
—
—
—
—
—
—
/ 2
/ 8
MHz
MHz
Unit
ns
ns
ns
ns
ns
ns
ns
ns
32