ATMEGA165-16MU Atmel, ATMEGA165-16MU Datasheet - Page 214

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ATMEGA165-16MU

Manufacturer Part Number
ATMEGA165-16MU
Description
IC AVR MCU 16K 16MHZ 64-QFN
Manufacturer
Atmel
Series
AVR® ATmegar
Datasheets

Specifications of ATMEGA165-16MU

Core Processor
AVR
Core Size
8-Bit
Speed
16MHz
Connectivity
SPI, UART/USART, USI
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
54
Program Memory Size
16KB (8K x 16)
Program Memory Type
FLASH
Eeprom Size
512 x 8
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-MLF®, 64-QFN
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Boundary-scan Chain
Boundary-scan Specific
JTAG Instructions
EXTEST; 0x0
IDCODE; 0x1
SAMPLE_PRELOAD; 0x2
AVR_RESET; 0xC
2573G–AVR–07/09
The Boundary-scan Chain has the capability of driving and observing the logic levels on
the digital I/O pins, as well as the boundary between digital and analog logic for analog
circuitry having off-chip connections.
See “Boundary-scan Chain” on page 216 for a complete description.
The Instruction Register is 4-bit wide, supporting up to 16 instructions. Listed below are
the JTAG instructions useful for Boundary-scan operation. Note that the optional HIGHZ
instruction is not implemented, but all outputs with tri-state capability can be set in high-
impedant state by using the AVR_RESET instruction, since the initial state for all port
pins is tri-state.
As a definition in this datasheet, the LSB is shifted in and out first for all Shift Registers.
The OPCODE for each instruction is shown behind the instruction name in hex format.
The text describes which Data Register is selected as path between TDI and TDO for
each instruction.
Mandatory JTAG instruction for selecting the Boundary-scan Chain as Data Register for
testing circuitry external to the AVR package. For port-pins, Pull-up Disable, Output
Control, Output Data, and Input Data are all accessible in the scan chain. For Analog cir-
cuits having off-chip connections, the interface between the analog and the digital logic
is in the scan chain. The contents of the latched outputs of the Boundary-scan chain is
driven out as soon as the JTAG IR-Register is loaded with the EXTEST instruction.
The active states are:
Optional JTAG instruction selecting the 32 bit ID-Register as Data Register. The ID-
Register consists of a version number, a device number and the manufacturer code
chosen by JEDEC. This is the default instruction after power-up.
The active states are:
Mandatory JTAG instruction for pre-loading the output latches and taking a snap-shot of
the input/output pins without affecting the system operation. However, the output latches
are not connected to the pins. The Boundary-scan Chain is selected as Data Register.
The active states are:
The AVR specific public JTAG instruction for forcing the AVR device into the Reset
mode or releasing the JTAG reset source. The TAP controller is not reset by this instruc-
tion. The one bit Reset Register is selected as Data Register. Note that the reset will be
active as long as there is a logic “one” in the Reset Chain. The output from this chain is
not latched.
Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.
Shift-DR: The Internal Scan Chain is shifted by the TCK input.
Update-DR: Data from the scan chain is applied to output pins.
Capture-DR: Data in the IDCODE Register is sampled into the Boundary-scan
Chain.
Shift-DR: The IDCODE scan chain is shifted by the TCK input.
Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.
Shift-DR: The Boundary-scan Chain is shifted by the TCK input.
Update-DR: Data from the Boundary-scan chain is applied to the output latches.
However, the output latches are not connected to the pins.
ATmega165/V
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