AD8345AREZ Analog Devices Inc, AD8345AREZ Datasheet - Page 4

• Manufacturer Part Number: AD8345AREZ
• Description: IC QUADRATURE MOD 250MHZ 16TSSOP
• Manufacturer: Analog Devices Inc

Specifications of AD8345AREZ

• Function: Modulator
• Lo Frequency: 250MHz ~ 1GHz
• Rf Frequency: 140MHz ~ 1GHz
• P1db: 2.5dBm
• Noise Floor: -155dBm/Hz
• Output Power: 2dBm
• Current - Supply: 78mA
• Voltage - Supply: 2.7 V ~ 5.5 V
• Test Frequency: 800MHz
• Package / Case: 16-TSSOP Exposed Pad, 16-eTSSOP, 16-HTSSOP
• Frequency Range: 140MHz To 1GHz
• Rf Type: Quadrature
• Supply Voltage Range: 2.7V To 5.5V
• Rf Ic Case Style: TSSOP
• No. Of Pins: 16
• Operating Temperature Range: -40°C To +85°C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD8345
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter
Supply Voltage VPS1, VPS2
Input Power LOIP, LOIN (re 50 Ω)
IBBP, IBBN, QBBP, QBBN
Internal Power Dissipation
θ
θ
Maximum Junction Temperature
Operating Temperature Range
Storage Temperature Range
Lead Temperature Range (Soldering 60 sec)
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degrada-
tion or loss of functionality.
JA
JA
(Exposed Paddle Soldered Down)
(Exposed Paddle not Soldered Down)
Rating
5.5 V
10 dBm
0 V, 2.5 V
−40°C to +85°C
−65°C to +150°C
500 mW
30°C/W
95°C/W
150°C
300°C
Rev. B | Page 4 of 20
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.