STM32F100RCT6 STMicroelectronics, STM32F100RCT6 Datasheet - Page 82
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STM32F100RCT6
Manufacturer Part Number
STM32F100RCT6
Description
IC ARM CORTEX MCU 256KB 64LQFP
Manufacturer
STMicroelectronics
Series
STM32r
Datasheet
1.STM32F100RCT6TR.pdf
(97 pages)
Specifications of STM32F100RCT6
Core Processor
ARM® Cortex-M3™
Core Size
32-Bit
Speed
24MHz
Connectivity
I²C, IrDA, LIN, SPI, UART/USART
Peripherals
DMA, PDR, POR, PVD, PWM, Temp Sensor, WDT
Number Of I /o
51
Program Memory Size
256KB (256K x 8)
Program Memory Type
FLASH
Ram Size
24K x 8
Voltage - Supply (vcc/vdd)
2 V ~ 3.6 V
Data Converters
A/D 16x12b; D/A 2x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-LFQFP
Core
ARM Cortex M3
For Use With
STM32100B-EVAL - EVAL BOARD FOR STM32F100VBT6
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Details
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
STM32F100RCT6
Manufacturer:
STMicroelectronics
Quantity:
500
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STMicroelectronics
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10 000
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Part Number:
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Manufacturer:
STMicroelectronics
Quantity:
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Part Number:
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Manufacturer:
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Part Number:
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Manufacturer:
STMicroelectronics
Quantity:
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Part Number:
STM32F100RCT6C
Manufacturer:
ST
Quantity:
20 000
Electrical characteristics
Note:
82/97
Table 52.
1. Guaranteed by design, not tested in production.
Table 53.
1. ADC DC accuracy values are measured after internal calibration.
2. Preliminary values.
Table 54.
1. ADC DC accuracy values are measured after internal calibration.
2. Better performance could be achieved in restricted V
3. Preliminary values.
ADC accuracy vs. negative injection current: Injecting a negative current on any of the
standard (non-robust) analog input pins should be avoided as this significantly reduces the
accuracy of the conversion being performed on another analog input. It is recommended to
add a Schottky diode (pin to ground) to standard analog pins which may potentially inject
negative currents.
1.5
7.5
13.5
28.5
41.5
55.5
71.5
239.5
Symbol
Symbol
EO
EG
EO
EG
ED
ED
ET
EL
ET
EL
T
Total unadjusted error
Offset error
Gain error
Differential linearity error
Integral linearity error
Total unadjusted error
Offset error
Gain error
Differential linearity error
Integral linearity error
s
R
(cycles)
ADC accuracy - limited test conditions
ADC accuracy
AIN
Parameter
Parameter
max for f
ADC
(1) (2) (3)
Doc ID 15081 Rev 5
0.125
0.625
1.125
2.375
3.45
4.625
5.96
20
= 12 MHz
f
f
V
V
T
Measurements made after
ADC calibration
f
f
V
T
Measurements made after
ADC calibration
PCLK2
ADC
PCLK2
ADC
A
A
DDA
REF+
DDA
= Full operating range
= 25 °C
= 12 MHz, R
= 12 MHz, R
(1)
= 3 V to 3.6 V
= 2.4 V to 3.6 V
t
STM32F100xC, STM32F100xD, STM32F100xE
= V
S
= 24 MHz,
= 24 MHz,
Test conditions
Test conditions
(µs)
DD
DDA
, frequency, V
AIN
AIN
(1)(2)
< 10 kΩ,
< 10 kΩ,
REF
0.4
5.9
11.4
25.2
37.2
50
NA
NA
and temperature ranges.
±1.5
±0.5
±1.5
±1.5
±1.5
±1.5
±1.5
±1.5
Typ
Typ
±1
±2
R
AIN
max (kΩ)
±2.5
±1.5
±2.5
±2.5
±4.5
Max
Max
±2
±3
±2
±2
±5
Unit
LSB
Unit
LSB