STM32F103RFT6 STMicroelectronics, STM32F103RFT6 Datasheet - Page 84

MCU 32BIT 768KB FLASH 64LQFP

STM32F103RFT6

Manufacturer Part Number
STM32F103RFT6
Description
MCU 32BIT 768KB FLASH 64LQFP
Manufacturer
STMicroelectronics
Series
STM32r
Datasheet

Specifications of STM32F103RFT6

Core Processor
ARM® Cortex-M3™
Core Size
32-Bit
Speed
72MHz
Connectivity
CAN, I²C, IrDA, LIN, MMC, SPI, UART/USART, USB
Peripherals
DMA, I²S, LCD, POR, PWM, WDT
Number Of I /o
51
Program Memory Size
768KB (768K x 8)
Program Memory Type
FLASH
Ram Size
96K x 8
Voltage - Supply (vcc/vdd)
2 V ~ 3.6 V
Data Converters
A/D 16x12b, D/A 2x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Processor Series
STM32F101xF
Core
ARM Cortex M3
Data Bus Width
32 bit
Data Ram Size
80 KB
Interface Type
I2C, SPI, UART
Maximum Clock Frequency
36 MHz
Number Of Programmable I/os
112
Number Of Timers
15
Operating Supply Voltage
2 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Operating Temperature Range
- 40 C to + 105 C
Processor To Be Evaluated
STM32F103RF
Supply Current (max)
28 mA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details
Other names
497-11114

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Electrical characteristics
5.3.13
84/120
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
These tests are compliant with EIA/JESD 78A IC latch-up standard.
Table 44.
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V
above V
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibilty to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into the
I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (>5
LSB TUE), out of spec current injection on adjacent pins or other functional failure (for
example reset, oscillator frequency deviation).
The test results are given in
Table 45.
I
INJ
Symbol
Symbol
LU
A supply overvoltage is applied to each power supply pin
A current injection is applied to each input, output and configurable I/O pin
DD
(for standard, 3 V-capable I/O pins) should be avoided during normal product
Static latch-up class
Electrical sensitivities
I/O current injection susceptibility
Injected current on OSC_IN32,
OSC_OUT32, PA4, PA5, PC13
Injected current on all FT pins
Injected current on any other pin
Parameter
Description
Table 45
Doc ID 16554 Rev 2
T
A
+105 °C conforming to JESD78A
Conditions
Functional susceptibility
Negative
injection
-5
-0
-5
STM32F103xF, STM32F103xG
injection
Positive
+0
+0
+5
II level A
Class
SS
Unit
mA
or

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