6MBI50U4A-120-50 FUJI ELECTRIC, 6MBI50U4A-120-50 Datasheet
6MBI50U4A-120-50
Specifications of 6MBI50U4A-120-50
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6MBI50U4A-120-50 Summary of contents
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... SPECIFICATION Device Name : Type Name : Spec. No. : K.Muramatsu Feb. 02 ’06 T.Miyasaka M.W atanabe Feb. 02 ’06 K.Yamada IGBT Module (RoHS compliant product) 6MBI50U4A-120-50 MS5F 6201 MS5F 6201 H04-004-07b ...
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Classi- Date Ind. fication Enactment Feb.-02-’06 a Revision Revised VCE(sat) (P4/14) Jun.-05 -’ Applied Content Drawn date Issued date K.Muramatsu MS5F 6201 Checked Checked Approved K.Yamada ...
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... Outline Drawing ( Unit : Equivalent circuit 25,26 25, 27,28 27,28 6MBI50U4A-120-50 (RoHS compliant product) shows theoretical dimension shows reference dimension 23,24 23,24 21,22 21, MS5F 6201 15,16 15, 19,20 19,20 13,14 13, H04-004-03a ...
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Absolute Maximum Ratings ( at Tc= 25 Items Collector-Emitter voltage Gate-Emitter voltage Collector current Collector Power Dissipation Junction temperature Storage temperature Isolation between terminal and copper base (*1) voltage between thermistor and others (*2) Screw Mounting (*3) Torque (*1) ...
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... Indication on module Logo of production 6MBI50U4A-120-50 Lot.No. 7. Applicable category This specification is applied to IGBT-Module named 6MBI50U4A-120-50. 8. Storage and transportation notes • The module should be stored at a standard temperature careful to solderability of the terminals if the module has passed over one year from manufacturing date, under the above storage condition. ...
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... The document (MS5F6209) about RoHS that Fuji Electric Device Technology issued is applied to this IGBT Module. The Japanese Edition(MS5F6212) is made into a reference grade. ...
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Reliability test results Test cate- Test items gories 1 Terminal Strength Pull force (Pull test) Test time 2 Mounting Strength Screw torque Test time 3 Vibration Range of frequency : 10 ~ 500Hz Sweeping time Acceleration Sweeping direction : ...
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Test cate- Test items gories 1 High temperature Reverse Bias Test temp. (for Collector-Emitter) Bias Voltage Bias Method Test duration 2 High temperature Bias (for gate) Test temp. Bias Voltage Bias Method Test duration 3 Temperature Humidity Bias Test temp. ...
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Reliability Test Results Test cate- Test items gories 1 Terminal Strength (Pull test) 2 Mounting Strength 3 Vibration 4 Shock 5 Solderability 6 Resistance to Soldering Heat 1 High Temperature Storage 2 Low Temperature Storage 3 Temperature Humidity Storage 4 ...
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Collector current vs. Collector-Emitter voltage (typ.) o Tj= chip 125 VGE=20V 12V 15V 100 Collector-Emitter voltage : VCE [ V ] Collector current vs. Collector-Emitter voltage (typ.) VGE=15V / chip ...
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Switching time vs. Collector current (typ.) Vcc=600V, VGE=±15V, RG=22Ω, Tj=25 10000 1000 toff ton 100 Collector current : Switching time vs. Gate resistance (typ.) Vcc=600V, Ic=50A, VGE=±15V, Tj=25 10000 ton 1000 ...
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Forward current vs. Forward on voltage (typ.) chip 125 100 o Tj=25 C Tj=125 Forward on voltage : Transient thermal resistance (max.) 1.00 0.10 0.01 0.001 0.010 0.100 Pulse ...
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This product shall be used within its absolute maximum rating (voltage, current, and temperature). This product may be broken in case of using beyond the ratings. If Printed Circuit Board is not suitable, the main pin terminals may have higher ...
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... The application examples described in this specification only explain typical ones that used the Fuji Electric Device Technology products. This specification never ensure to enforce the industrial property and other rights, nor license the enforcement rights. 本 ...