CY62146ELL-45ZSXIT Cypress Semiconductor Corp, CY62146ELL-45ZSXIT Datasheet - Page 5

CY62146ELL-45ZSXIT

CY62146ELL-45ZSXIT

Manufacturer Part Number
CY62146ELL-45ZSXIT
Description
CY62146ELL-45ZSXIT
Manufacturer
Cypress Semiconductor Corp
Datasheet

Specifications of CY62146ELL-45ZSXIT

Format - Memory
RAM
Memory Type
SRAM
Memory Size
4M (256K x 16)
Speed
45ns
Interface
Parallel
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
-40°C ~ 85°C
Package / Case
44-TSOP II
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Data Retention Characteristics
Over the Operating Range
Notes
Document Number: 001-07970 Rev. *G
V
I
t
t
9. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V
10. Chip enable (CE) and byte enables (BHE and BLE) need to be tied to CMOS levels to meet the I
11. Tested initially and after any design or process changes that may affect these parameters.
12. Full device operation requires linear V
CCDR
CDR
R
Parameter
DR
[12]
[11]
[10]
V
CE
CC
V
Data retention current
Chip deselect to data
retention time
Operation recovery time
CC
Parameters
OUTPUT
for data retention
INCLUDING
R
V
V
R1
R2
SCOPE
JIG AND
TH
TH
CC
Description
30 pF
R1
CC
ramp from V
R2
V
Figure 2. AC Test Loads and Waveforms
V
V
t
CC(min)
CDR
DR
CC
IN
Figure 3. Data Retention Waveform
to V
Rise Time = 1 V/ns
> V
= 2 V, CE > V
CC(min)
CC
– 0.2 V or V
> 100 s or stable at V
GND
V
CC
Equivalent to:
Conditions
DATA RETENTION MODE
CC
5.0 V
1800
1.77
990
639
10%
– 0.2 V,
IN
OUTPUT
< 0.2 V
V
DR
> 2.0 V
ALL INPUT PULSES
CC(min)
90%
THÉ VENIN EQUIVALENT
SB2
> 100 s.
/ I
CCDR
spec. Other inputs are left floating.
R
TH
Min
45
CC
90%
2
0
= V
10%
V
Fall Time = 1 V/ns
CC(typ)
CC(min)
V
t
R
TH
CY62146E MoBL
Typ
, T
1
A
[9]
= 25 °C.
Unit
V
Max
7
Page 5 of 14
Unit
A
ns
ns
V
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