CYIL2SC1300AA-GZDC Cypress Semiconductor Corp, CYIL2SC1300AA-GZDC Datasheet - Page 12
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CYIL2SC1300AA-GZDC
Manufacturer Part Number
CYIL2SC1300AA-GZDC
Description
IMAGE SENSOR CMOS LUPA-1300-2
Manufacturer
Cypress Semiconductor Corp
Type
CMOS Imagingr
Datasheet
1.CYIL2SM1300-EVAL.pdf
(41 pages)
Specifications of CYIL2SC1300AA-GZDC
Pixel Size
14µm x 14µm
Active Pixel Array
1280H x 1024V
Frames Per Second
500
Voltage - Supply
2.5V, 3.3V
Package / Case
168-PGA
Package
168CuPGA
Image Size
1280x1024 Pixels
Color Sensing
Color
Operating Temperature
0 to 70 °C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Table 13. Internal Registers (continued)
Document Number: 001-24599 Rev. *C
Data Block
Data Block
(continued)
Block
Fix10
dataconfig1
dataconfig2
Fix11
dacvrefadc
Fix12
Fix13
Fix14
datachannel0_1
datachannel0_2
datachannel1_1
datachannel1_2
datachannel12_1
datachannel12_2
Fix9
Register Name
Address [6..0]
21
22
23
24
25
26
27
28
29
30
31
32
33
54
55
Field
[7:0]
[7:0]
[1:0]
[7:6]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[7:0]
[5:4]
[7:0]
[5:4]
[7:0]
[5:4]
[7:0]
[2]
[3]
[4]
[5]
[0]
[1]
[2]
[3]
[0]
[1]
[2]
[3]
[0]
[1]
[2]
[3]
0x20
0xC0
0x00
0
0
0
0
0x03
0x2A
0
0x80
0x80
0
0
0
0
0x00
0x00
0
0
0
0
0x00
0x00
0
0
0
0
0x00
0x00
Reset Value
Reserved, fixed value
Reserved, fixed value
Reserved, fixed value
‘1’: Enables user upload of dacvrefadc register value
‘0’: Keeps default value
Enable PRBS generation
Reserved, fixed value
Reserved, fixed value
Training pattern inserted to sync LVDS receivers
Training pattern inserted to sync LVDS receivers
Reserved, fixed value
Input to DAC to set the offset at the input of the ADC
Reserved, fixed value
Reserved, fixed value
Reserved, fixed value
Bypass the data block
Enables the FPN correction
Overwrite incoming ADC data by the data in the
testpat register
Reserved, fixed value
Pattern inserted to generate a test image
Pattern inserted to generate a test image
Bypass the data block
Enables the FPN correction
Overwrite incoming ADC data by the data in the
testpat register
Reserved, fixed value
Pattern inserted to generate a test image
Pattern inserted to generate a test image
Bypass the data block
Enables the FPN correction
Overwrite incoming ADC data by the data in the
testpat register
Reserved, fixed value
Pattern inserted to generate a test image
Pattern inserted to generate a test image
Description
CYIL2SM1300AA
Page 12 of 41
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