USB3320C-EZK Standard Microsystems (SMSC), USB3320C-EZK Datasheet - Page 77

• Manufacturer Part Number: USB3320C-EZK
• Description: USB PHY
• Manufacturer: Standard Microsystems (SMSC)

Specifications of USB3320C-EZK

• Lead Free Status / RoHS Status: Compliant

Highly Integrated Full Featured Hi-Speed USB 2.0 ULPI Transceiver
Datasheet
SMSC USB3320
8.3.1
8.3.2
8.3.3
8.3.4
Human Body Model (HBM) Performance
HBM testing verifies the ability to withstand the ESD strikes like those that occur during handling and
manufacturing, and is done without power applied to the IC. To pass the test, the device must have
no change in operation or performance due to the event. All pins on the USB3320 except the REFCLK,
SPK_L, and SPK_R pins provide ±8kV HBM protection, as shown in
EN/IEC 61000-4-2 Performance
The EN/IEC 61000-4-2 ESD specification is an international standard that addresses system-level
immunity to ESD strikes while the end equipment is operational. In contrast, the HBM ESD tests are
performed at the device level with the device powered down.
SMSC contracts with Independent laboratories to test the USB3320 to EN/IEC 61000-4-2 in a working
system. Reports are available upon request. Please contact your SMSC representative, and request
information on 3rd party ESD test results. The reports show that systems designed with the USB3320
can safely provide the ESD performance shown in
In addition to defining the ESD tests, EN/IEC 61000-4-2 also categorizes the impact to equipment
operation when the strike occurs (ESD Result Classification). The USB3320 maintains an ESD Result
Classification 1 or 2 when subjected to an EN/IEC 61000-4-2 (level 4) ESD strike.
Both air discharge and contact discharge test techniques for applying stress conditions are defined by
the EN/IEC 61000-4-2 ESD document.
Air Discharge
To perform this test, a charged electrode is moved close to the system being tested until a spark is
generated. This test is difficult to reproduce because the discharge is influenced by such factors as
humidity, the speed of approach of the electrode, and construction of the test equipment.
Contact Discharge
The uncharged electrode first contacts the USB connector to prepare this test, and then the probe tip
is energized. This yields more repeatable results, and is the preferred test method. The independent
test laboratories contracted by SMSC provide test results for both types of discharge methods.
DATASHEET
77
Table 4.10
without additional board level protection.
Table
4.10.
Revision 1.0 (07-14-09)