5962-8984105KA QP SEMICONDUCTOR, 5962-8984105KA Datasheet - Page 9
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5962-8984105KA
Manufacturer Part Number
5962-8984105KA
Description
Manufacturer
QP SEMICONDUCTOR
Datasheet
1.5962-8984105KA.pdf
(21 pages)
Specifications of 5962-8984105KA
Lead Free Status / RoHS Status
Not Compliant
DEFENSE SUPPLY CENTER COLUMBUS
DSCC FORM 2234
APR 97
included.
4.3.1d).
COLUMBUS, OHIO 43216-5000
1/ The maximum leakage current is due to the internal pull-up resistor on all pins.
2/ These are absolute values with respect to device ground and all overshoots due to system or tester noise are
3/ Not more than one output at a time should be shorted. Short circuit test duration should not exceed 1 second (see
4/ AC tests are performed with input rise and fall times (10 percent to 90 percent) of 3.0 ns, timing reference levels of
5/ Test applies only to registered outputs.
6/ Transition is measured at steady-state high level -500 mV or steady-state low level +500 mV on the output from
7/ Tested initially and after any design or process changes that affect that parameter, and therefore shall be
MICROCIRCUIT DRAWING
1.5 V, input pulse levels of 0 V to 3.0 V and the output load of figure 3. Input pulse levels are absolute values with
respect to device ground and all overshoots due to system or tester noise are included.
the 1.5 V level on the input.
guaranteed to the limits specified in table I.
STANDARD
* PDA applies to subgroups 1 and 7
** See 4.3.1c
MIL-STD-883 test requirements
Interim electrical parameters
(method 5004)
Final electrical test parameters
(method 5004)
Group A test requirements
(method 5005)
Groups C and D end-point
Electrical parameters
(method 5005)
Table I. Electrical performance characteristics - Continued.
TABLE II. Electrical test requirements.
SIZE
A
REVISION LEVEL
MIL-STD-883, method 5005,
(in accordance with
1, 2,3, 4**, 7, 8A,
1*, 2,3, 7*, 8A,
2, 3, 7, 8A, 8B
8B, 9, 10, 11
8B, 9, 10, 11
Subgroups
J
table I)
- - -
SHEET
5962-89841
9