5962-89689012A QP SEMICONDUCTOR, 5962-89689012A Datasheet - Page 15

• Manufacturer Part Number: 5962-89689012A
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-89689012A

• Logical Function: Mux
• Configuration: 4 x 2:1
• Number Of Inputs: 8
• Number Of Outputs: 4
• Operating Supply Voltage (typ): 5V
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Power Dissipation: 500mW
• Operating Temp Range: -55C to 125C
• Operating Temperature Classification: Military
• Mounting: Surface Mount
• Pin Count: 20
• Package Type: CLLCC
• Lead Free Status / RoHS Status: Not Compliant

DSCC FORM 2234
APR 97
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a.
b.
c.
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
DEFENSE SUPPLY CENTER COLUMBUS
A
= +125C, minimum.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
Interim electrical
Final electrical
Group A test
Group C end-point electrical
Group D end-point electrical
Group E end-point electrical
2/ PDA applies to subgroups 1, 7, and deltas.
3/ Delta limits, as specified in table III, shall be required where specified, and the delta limits shall be completed
1/ PDA applies to subgroup 1.
parameters (see 4.2)
parameters (see 4.2)
requirements (see 4.4)
parameters (see 4.4)
parameters (see 4.4)
parameters (see 4.4)
with reference to the zero hour electrical parameters.
STANDARD
Test requirements
Supply current
Supply current delta
Input current low level
Input current high level
Output voltage low level
Output voltage high level
(V
(V
CC
CC
= 5.5 V, I
= 5.5 V, I
TABLE III. Burn-in and operating life test, delta parameters (+25C).
Parameter 1/
1/ These parameters shall be recorded before and after the
2/ The limit may not be production tested.
required burn-in and life tests to determine delta limits.
OL
OH
= +24 mA)
= -24 mA)
TABLE II. Electrical test requirements.
method 5005, table I)
(in accordance with
MIL-STD-883,
1/ 1, 2, 3, 7,
1, 2, 3, 4, 7,
8, 9, 10, 11
8, 9, 10, 11
Subgroups
I
1, 2, 3
1, 2, 3
1, 7, 9
CCH
class M
Device
- - -
Symbol
, I
I
V
V
CCL
I
I
IH
IL
OH
OL
CC
, I
CCZ
SIZE
A
Device types
1/ 1, 2, 3, 7,
1, 2, 3, 4, 7,
8, 9, 10, 11
8, 9, 10, 11
1, 2, 3
1, 2, 3
1, 7, 9
class Q
Device
01
02
02
02
02
02
02
- - -
MIL-PRF-38535, table III)
REVISION LEVEL
(in accordance with
Subgroups
Delta Limits
100 nA 2/
300 nA
0.4 mA
D
0.04 V
0.20 V
20 nA
20 nA
2/ 3/ 1, 2, 3, 7,
3/ 1, 2, 3, 7,8,
1, 2, 3, 4, 7,
8, 9, 10, 11
8, 9, 10, 11
class V
Device
9, 10, 11
1, 2, 3
1, 7, 9
1
SHEET
5962-89689
15