EPM7064SLI44-7N Altera, EPM7064SLI44-7N Datasheet - Page 25

IC MAX 7000 CPLD 64 44-PLCC

EPM7064SLI44-7N

Manufacturer Part Number
EPM7064SLI44-7N
Description
IC MAX 7000 CPLD 64 44-PLCC
Manufacturer
Altera
Series
MAX® 7000r
Datasheet

Specifications of EPM7064SLI44-7N

Programmable Type
In System Programmable
Delay Time Tpd(1) Max
7.5ns
Voltage Supply - Internal
4.5 V ~ 5.5 V
Number Of Logic Elements/blocks
4
Number Of Macrocells
64
Number Of Gates
1250
Number Of I /o
36
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
44-PLCC
Voltage
5V
Memory Type
EEPROM
Number Of Logic Elements/cells
4
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Features
-
Other names
544-2017
EPM7064SLI44-7N
Design Security
Generic Testing
QFP Carrier &
Development
Socket
Altera Corporation
f
All MAX 7000 devices contain a programmable security bit that controls
access to the data programmed into the device. When this bit is
programmed, a proprietary design implemented in the device cannot be
copied or retrieved. This feature provides a high level of design security
because programmed data within EEPROM cells is invisible. The security
bit that controls this function, as well as all other programmed data, is
reset only when the device is reprogrammed.
Each MAX 7000 device is functionally tested. Complete testing of each
programmable EEPROM bit and all internal logic elements ensures 100%
programming yield. AC test measurements are taken under conditions
equivalent to those shown in
erased during early stages of the production flow.
Figure 10. MAX 7000 AC Test Conditions
MAX 7000 and MAX 7000E devices in QFP packages with 100 or more
pins are shipped in special plastic carriers to protect the QFP leads. The
carrier is used with a prototype development socket and special
programming hardware available from Altera. This carrier technology
makes it possible to program, test, erase, and reprogram a device without
exposing the leads to mechanical stress.
For detailed information and carrier dimensions, refer to the
& Development Socket Data
1
Power supply transients can affect AC
measurements. Simultaneous
transitions of multiple outputs should be
avoided for accurate measurement.
Threshold tests must not be performed
under AC conditions. Large-amplitude,
fast ground-current transients normally
occur as the device outputs discharge
the load capacitances. When these
transients flow through the parasitic
inductance between the device ground
pin and the test system ground,
significant reductions in observable
noise immunity can result. Numbers in
brackets are for 2.5-V devices and
outputs. Numbers without brackets are
for 3.3-V devices and outputs.
MAX 7000S devices are not shipped in carriers.
MAX 7000 Programmable Logic Device Family Data Sheet
Sheet.
Figure
10. Test patterns can be used and then
Device
Output
Device input
rise and fall
times < 3 ns
[8.06
[703 Ω]
250
464 Ω
Ω
]
C1 (includes JIG
capacitance)
QFP Carrier
VCC
To Test
System
25

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