ISL3178AEMBZ-T Intersil, ISL3178AEMBZ-T Datasheet - Page 6

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ISL3178AEMBZ-T

Manufacturer Part Number
ISL3178AEMBZ-T
Description
TXRX ESD 3.3V RS485/422 8-SOIC
Manufacturer
Intersil
Type
Transceiverr
Datasheet

Specifications of ISL3178AEMBZ-T

Number Of Drivers/receivers
1/1
Protocol
RS422, RS485
Voltage - Supply
3 V ~ 3.6 V
Mounting Type
Surface Mount
Package / Case
8-SOIC (3.9mm Width)
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Electrical Specifications
NOTES:
10. Δt
12. Limits established by characterization and are not production tested.
13. If the Tx or Rx enable function isn’t needed, connect the enable pin to the appropriate supply (see “Pin Descriptions” on page 2) through a 1kΩ
14. For wafer sale the switching test limits are established by characterization.
Test Circuits and Waveforms
11. V
Receiver Enable from Shutdown to
Output High
Receiver Enable from Shutdown to
Output Low
2. All currents into device pins are positive; all currents out of device pins are negative. All voltages are referenced to device ground unless
3. Supply current specification is valid for loaded drivers when DE = 0V.
4. Applies to peak current. See “Typical Performance Curves” starting on page 10 for more information.
5. When testing devices with the shutdown feature, keep RE = 0 to prevent the device from entering SHDN.
6. When testing devices with the shutdown feature, the RE signal high time must be short enough (typically <100ns) to prevent the device from
7. Versions with a shutdown feature are put into shutdown by bringing RE high and DE low. If the inputs are in this state for less than 50ns, the parts
8. Keep RE = VCC, and set the DE signal low time >600ns to ensure that the device enters SHDN.
9. Set the RE signal high time >600ns to ensure that the device enters SHDN.
otherwise specified.
entering SHDN.
are guaranteed not to enter shutdown. If the inputs are in this state for at least 600ns, the parts are guaranteed to have entered shutdown. See
“Low Power Shutdown Mode” on page 10.
temperature, etc.).
to 3kΩ resistor.
CC
SKEW
V
CC
≥ 3.15V
PARAMETER
is the magnitude of the difference in propagation delays of the specified terminals of two units tested with identical test conditions (V
DE
DI
FIGURE 1A. V
D
Z
Y
6
OD
V
Test Conditions: V
(Note 2). Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified.
Temperature limits established by characterization and are not production tested.
OD
t
t
SYMBOL
ZH(SHDN)
ZL(SHDN)
AND V
OC
R
R
L
L
/2
/2
R
(Notes 7, 9)
R
(Notes 7, 9)
FIGURE 1. DC DRIVER TEST CIRCUITS
L
L
= 1kΩ, C
CC
= 1kΩ, C
V
OC
= 3.0V to 3.6V; Unless Otherwise Specified. Typicals are at V
TEST CONDITIONS
L
L
ISL3178AE
= 15pF, SW = GND (Figure 6),
= 15pF, SW = V
V
CC
CC
(Figure 6),
DE
DI
FIGURE 1B. V
D
TEMP
Z
Y
(°C)
Full
Full
OD
WITH COMMON MODE LOAD
V
MIN
OD
-
-
CC
TYP
240
240
R
L
= 3.3V, T
= 60Ω
MAX
500
500
A
375Ω
375Ω
= +25°C,
-7V TO +12V
May 6, 2009
FN6887.1
UNITS
V
ns
ns
CM
CC
,

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