UJA1069TW24/5V0/C, NXP Semiconductors, UJA1069TW24/5V0/C, Datasheet - Page 47

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UJA1069TW24/5V0/C,

Manufacturer Part Number
UJA1069TW24/5V0/C,
Description
IC LIN FAIL-SAFE 24HTSSOP
Manufacturer
NXP Semiconductors
Datasheet

Specifications of UJA1069TW24/5V0/C,

Applications
*
Interface
*
Voltage - Supply
*
Package / Case
24-TSSOP Exposed Pad, 24-eTSSOP, 24-HTSSOP
Mounting Type
Surface Mount
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
935285413512
NXP Semiconductors
Table 25.
T
voltages are defined with respect to ground. Positive currents flow into the IC.
[1]
[2]
UJA1069_4
Product data sheet
Symbol
I
I
TEST input; pin TEST
V
R
Temperature detection
T
RTLIN(pu)
LL
vj
j(warn)
th(TEST)
(pd)TEST
= 40 C to +150 C, V
All parameters are guaranteed over the virtual junction temperature range by design. Products are 100 % tested at 125 C ambient
temperature on wafer level (pretesting). Cased products are 100 % tested at 25 C ambient temperature (final testing). Both pretesting
and final testing use correlated test conditions to cover the specified temperature and power supply voltage range.
Not tested in production.
Static characteristics
Parameter
RTLIN pull-up
current
LOW-level leakage
current
input threshold
voltage
pull-down resistor
high junction
temperature warning
level
BAT42
= 5.5 V to 52 V; V
…continued
Conditions
Active mode;
V
t > t
Off-line mode;
V
t < t
Off-line mode;
V
t > t
for entering Software
development mode;
T
for entering Forced normal
mode; T
between pin TEST and GND
j
RTLIN
RTLIN
RTLIN
= 25 C
LIN(dom)(det)
LIN(dom)(det)
LIN(dom)(det)
BAT14
Rev. 04 — 28 October 2009
= V
= V
= V
j
= 25 C
LIN
LIN
LIN
= 5.5 V to 27 V; V
= 0 V;
= 0 V;
= 0 V;
BAT42
[1]
Min
1
2
2
160
150
150
10
V
BAT14
LIN fail-safe system basis chip
1 V; unless otherwise specified. All
Typ
0
5
10
4
175
60
60
UJA1069
Max
+10
8
13.5
8
190
© NXP B.V. 2009. All rights reserved.
35
35
Unit
V
V
k
47 of 64
C
A
A
A

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