A3PN060-VQG100 Actel, A3PN060-VQG100 Datasheet - Page 34
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A3PN060-VQG100
Manufacturer Part Number
A3PN060-VQG100
Description
Manufacturer
Actel
Datasheet
1.A3PN060-ZVQG100I.pdf
(100 pages)
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ProASIC3 nano DC and Switching Characteristics
Table 2-27 • Minimum and Maximum DC Input and Output Levels
Figure 2-6 • AC Loading
Table 2-28 • 3.3 V LVTTL/LVCMOS AC Waveforms, Measuring Points, and Capacitive Loads
2 -2 0
3.3 V LVTTL /
3.3 V LVCMOS
Drive Strength
2 mA
4 mA
6 mA
8 mA
Notes:
1. I
2. I
3. Currents are measured at high temperature (100°C junction temperature) and maximum voltage.
4. Currents are measured at 85°C junction temperature.
5. Software default selection highlighted in gray.
Input LOW (V)
0
Notes:
1. Measuring point = V
2. Capacitive Load for A3PN060, A3PN125, and A3PN250 is 35 pF.
V
current is larger when operating outside recommended ranges.
IL
IH
IL
is the input leakage current per I/O pin over recommended operation conditions where –0.3 V < V
.
is the input leakage current per I/O pin over recommended operating conditions V
Single-Ended I/O Characteristics
3.3 V LVTTL / 3.3 V LVCMOS
Low-Voltage Transistor–Transistor Logic (LVTTL) is a general-purpose standard (EIA/JESD) for 3.3 V
applications. It uses an LVTTL input buffer and push-pull output buffer.
Min.,
Test Point
Datapath
–0.3
–0.3
–0.3
–0.3
V
V
trip.
IL
Max.,
0.8
0.8
0.8
0.8
See
V
Table 2-16 on page 2-16
Input HIGH (V)
35 pF
Min.,
V
2
2
2
2
3.3
V
IH
Max.,
3.6
3.6
3.6
3.6
V
Enable Path
Test Point
A d v a n c e v 0. 2
R = 1 k
Max.,
V
0.4
0.4
0.4
0.4
V
OL
for a complete table of trip points.
Measuring Point* (V)
Min.,
V
2.4
2.4
2.4
2.4
V
OH
R to V
R to GND for t
35 pF for t
5 pF for t
1.4
I
m
OL
A
2
4
6
8
CCI
I
m
A
H
2
6
O
4
8
for t
HZ
ZH
/t
Max., mA
/t
LZ
LZ
ZH
HZ
I
OSL
25
25
51
51
/t
/t
S/t
ZL
ZH
/t
ZL
ZLS
/t
3
/t
ZHS
ZLS
IH
Max., mA
C
< V
LOAD
I
OSH
27
27
54
54
IN
10
< V
(pF)
3
CCI
µA
10
10
10
I
10 10
1
4
IL
. Input
IN
µA
I
10
10
10
IH
2
4
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