AT32UC3B0128 Atmel Corporation, AT32UC3B0128 Datasheet - Page 596
AT32UC3B0128
Manufacturer Part Number
AT32UC3B0128
Description
Manufacturer
Atmel Corporation
Datasheets
1.AT32UC3A0128.pdf
(377 pages)
2.AT32UC3A0128.pdf
(33 pages)
3.AT32UC3A0128.pdf
(159 pages)
4.AT32UC3B0128.pdf
(684 pages)
5.AT32UC3B0128.pdf
(107 pages)
Specifications of AT32UC3B0128
Flash (kbytes)
128 Kbytes
Pin Count
64
Max. Operating Frequency
60 MHz
Cpu
32-bit AVR
# Of Touch Channels
32
Hardware Qtouch Acquisition
No
Max I/o Pins
44
Ext Interrupts
44
Usb Transceiver
1
Usb Speed
Full Speed
Usb Interface
Device + OTG
Spi
4
Twi (i2c)
1
Uart
3
Ssc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
8
Adc Resolution (bits)
10
Adc Speed (ksps)
384
Resistive Touch Screen
No
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
32
Self Program Memory
YES
Dram Memory
No
Nand Interface
No
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
3.0-3.6 or (1.65-1.95+3.0-3.6)
Operating Voltage (vcc)
3.0-3.6 or (1.65-1.95+3.0-3.6)
Fpu
No
Mpu / Mmu
Yes / No
Timers
10
Output Compare Channels
16
Input Capture Channels
6
Pwm Channels
13
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes
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27.5.3.2
32059L–AVR32–01/2012
MEMORY_SERVICE
Starting in Run-Test/Idle, OCD registers are accessed in the following way:
For any operation, the full 7 bits of the address must be provided. For write operations, 32 data
bits must be provided, or the result will be undefined. For read operations, shifting may be termi-
nated once the required number of bits have been acquired.
Table 27-16. NEXUS_ACCESS Details
This instruction allows access to registers in an optional Memory Service Unit. The 7-bit register
index, a read/write control bit, and the 32-bit data is accessed through the JTAG port.
The data register is alternately interpreted by the SAB as an address register and a data regis-
ter. The SAB starts in address mode after the MEMORY_SERVICE instruction is selected, and
toggles between address and data mode each time a data scan completes with the busy bit
cleared.
Starting in Run-Test/Idle, Memory Service registers are accessed in the following way:
Instructions
IR input value
IR output value
DR Size
DR input value (Address phase)
DR input value (Data read phase)
DR input value (Data write phase)
DR output value (Address phase)
DR output value (Data read phase)
DR output value (Data write phase)
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Shift-DR: Scan in the direction bit (1=read, 0=write) and the 7-bit address for the
7. Go to Update-DR and re-enter Select-DR Scan.
8. In Shift-DR: For a read operation, scan out the contents of the addressed register. For a
9. Return to Run-Test/Idle.
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Shift-DR: Scan in the direction bit (1=read, 0=write) and the 7-bit address for the
OCD register.
write operation, scan in the new contents of the register.
Memory Service register.
Details
10000 (0x10)
peb01
34 bits
aaaaaaar xxxxxxxx xxxxxxxx xxxxxxxx xx
xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxxx xx
dddddddd dddddddd dddddddd dddddddd xx
xx xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxeb
eb dddddddd dddddddd dddddddd dddddddd
xx xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxeb
596
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