ATxmega256A3 Atmel Corporation, ATxmega256A3 Datasheet - Page 41
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ATxmega256A3
Manufacturer Part Number
ATxmega256A3
Description
Manufacturer
Atmel Corporation
Specifications of ATxmega256A3
Flash (kbytes)
256 Kbytes
Pin Count
64
Max. Operating Frequency
32 MHz
Cpu
8-bit AVR
# Of Touch Channels
16
Hardware Qtouch Acquisition
No
Max I/o Pins
50
Ext Interrupts
50
Usb Speed
No
Usb Interface
No
Spi
10
Twi (i2c)
2
Uart
7
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
16
Adc Resolution (bits)
12
Adc Speed (ksps)
2000
Analog Comparators
4
Resistive Touch Screen
No
Dac Channels
2
Dac Resolution (bits)
12
Temp. Sensor
Yes
Crypto Engine
AES/DES
Sram (kbytes)
16
Eeprom (bytes)
4096
Self Program Memory
YES
Dram Memory
No
Nand Interface
No
Picopower
Yes
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.6 to 3.6
Operating Voltage (vcc)
1.6 to 3.6
Fpu
No
Mpu / Mmu
no / no
Timers
7
Output Compare Channels
22
Input Capture Channels
22
Pwm Channels
22
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes
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25. ADC - 12-bit Analog to Digital Converter
25.1
25.2
8068T–AVR–12/10
Features
Overview
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XMEGA A3 devices have two Analog to Digital Converters (ADC), see
The two ADC modules can be operated simultaneously, individually or synchronized.
The ADC converts analog voltages to digital values. The ADC has 12-bit resolution and is capa-
ble of converting up to 2 million samples per second. The input selection is flexible, and both
single-ended and differential measurements can be done. For differential measurements an
optional gain stage is available to increase the dynamic range. In addition several internal signal
inputs are available. The ADC can provide both signed and unsigned results.
This is a pipeline ADC. A pipeline ADC consists of several consecutive stages, where each
stage convert one part of the result. The pipeline design enables high sample rate at low clock
speeds, and remove limitations on samples speed versus propagation delay. This also means
that a new analog voltage can be sampled and a new ADC measurement started while other
ADC measurements are ongoing.
ADC measurements can either be started by application software or an incoming event from
another peripheral in the device. Four different result registers with individual input selection
(MUX selection) are provided to make it easier for the application to keep track of the data. Each
result register and MUX selection pair is referred to as an ADC Channel. It is possible to use
DMA to move ADC results directly to memory or peripherals when conversions are done.
Both internal and external analog reference voltages can be used. An accurate internal 1.0V
reference is available.
An integrated temperature sensor is available and the output from this can be measured with the
ADC. The output from the DAC, VCC/10 and the Bandgap voltage can also be measured by the
ADC.
Two ADCs with 12-bit resolution
2 Msps sample rate for each ADC
Signed and Unsigned conversions
4 result registers with individual input channel control for each ADC
8 single ended inputs for each ADC
8x4 differential inputs for each ADC
4 internal inputs:
Software selectable gain of 2, 4, 8, 16, 32 or 64
Software selectable resolution of 8- or 12-bit.
Internal or External Reference selection
Event triggered conversion for accurate timing
DMA transfer of conversion results
Interrupt/Event on compare result
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Integrated Temperature Sensor
DAC Output
VCC voltage divided by 10
Bandgap voltage
Figure 25-1 on page
XMEGA A3
42.
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