SAM7SE512 Atmel Corporation, SAM7SE512 Datasheet - Page 49
SAM7SE512
Manufacturer Part Number
SAM7SE512
Description
Manufacturer
Atmel Corporation
Specifications of SAM7SE512
Flash (kbytes)
512 Kbytes
Pin Count
144
Max. Operating Frequency
48 MHz
Cpu
ARM7TDMI
Hardware Qtouch Acquisition
No
Max I/o Pins
88
Ext Interrupts
88
Usb Transceiver
1
Usb Speed
Full Speed
Usb Interface
Device
Spi
1
Twi (i2c)
1
Uart
3
Ssc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
8
Adc Resolution (bits)
10
Adc Speed (ksps)
384
Resistive Touch Screen
No
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
32
Self Program Memory
NO
External Bus Interface
1
Dram Memory
sdram
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
3.0 to 3.6
Fpu
No
Mpu / Mmu
Yes / No
Timers
3
Output Compare Channels
3
Input Capture Channels
3
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
No
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12. Debug and Test Features
12.1
12.2
6222F–ATARM–14-Jan-11
Overview
Block Diagram
The SAM7SE Series Microcontrollers feature a number of complementary debug and test capa-
bilities. A common JTAG/ICE (Embedded ICE) port is used for standard debugging functions,
such as downloading code and single-stepping through programs. The Debug Unit provides a
two-pin UART that can be used to upload an application into internal SRAM. It manages the
interrupt handling of the internal COMMTX and COMMRX signals that trace the activity of the
Debug Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
Figure 12-1. Debug and Test Block Diagram
PDC
Boundary
ARM7TDMI
TAP
DBGU
ICE
ICE/JTAG
TAP
Reset
Test
and
SAM7SE512/256/32
POR
JTAGSEL
TDO
TMS
TCK
TDI
DTXD
DRXD
TST
49
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