IS61LV256AL Integrated Silicon Solution, Inc., IS61LV256AL Datasheet - Page 7

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IS61LV256AL

Manufacturer Part Number
IS61LV256AL
Description
32k X 8 Low Voltage Cmos Static Ram
Manufacturer
Integrated Silicon Solution, Inc.
Datasheet

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AC WAVEFORMS
WRITE CYCLE NO. 1
WRITE CYCLE SWITCHING CHARACTERISTICS
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V
2. The internal write time is defined by the overlap of CE LOW and WE LOW. All signals must be in valid states to initiate a
3. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. B
10/23/06
IS61LV256AL
Symbol
t
t
t
t
t
t
t
t
t
t
t
and output loading specified in Figure 1.
Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising
or falling edge of the signal that terminates the Write.
WC
AW
HA
SD
HD
SCE
SA
PWE
PWE
HZWE
LZWE
ADDRESS
1
2
(3)
(3)
D
OUT
WE
D
CE
IN
Parameter
Write Cycle Time
CE to Write End
Address Setup Time
to Write End
Address Hold
from Write End
Address Setup Time
WE Pulse Width (OE HIGH)
WE Pulse Width (OE LOW)
Data Setup to Write End
Data Hold from Write End
WE LOW to High-Z Output
WE HIGH to Low-Z Output
DATA UNDEFINED
t
(CE Controlled, OE is HIGH or LOW)
SA
t
HZWE
t
VALID ADDRESS
AW
t
t
PWE1
PWE2
t
t
Min.
SCE
6.5
WC
10
10
8
8
0
0
7
0
0
-10 ns
HIGH-Z
(1,2)
Max.
3.5
(1 )
t
(Over Operating Range)
SD
DATA
IN
VALID
Min. Max.
12
12
8
8
0
0
8
7
0
0
-12 ns
t
HD
t
LZWE
5
t
HA
CE_WR1.eps
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ISSI
®
7

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