MT55L128L32P1 Micron Semiconductor Products, Inc., MT55L128L32P1 Datasheet - Page 20

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MT55L128L32P1

Manufacturer Part Number
MT55L128L32P1
Description
4Mb ZBT SRAM, 3.3V Vdd, 3.3V or 2.5V I/O, Pipelined,
Manufacturer
Micron Semiconductor Products, Inc.
Datasheet

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3.3V I/O AC TEST CONDITIONS
LOAD DERATING CURVES
SRAM timing is dependent upon the capacitive load-
ing on the outputs.
voltage curves.
4Mb: 256K x 18, 128K x 32/36 Pipelined ZBT SRAM
MT55L256L18P1_F.p65 – Rev. F, Pub. 1/03 EN
Input pulse levels ................................... V
Input rise and fall times ..................................... 1ns
Input timing reference levels .......................... 1.5V
Output reference levels ................................... 1.5V
Output load ............................. See Figures 1 and 2
The Micron 256K x 18, 128K x 32, and 128K x 36 ZBT
Consult the factory for copies of I/O current versus
3.3V I/O Output Load Equivalents
Q
Q
351
Z = 50Ω
O
Figure 1
Figure 2
+3.3V
V = 1.5V
T
317
5pF
50Ω
SS
to 3.3V
20
2.5V I/O AC TEST CONDITIONS
Input pulse levels ................................... V
Input rise and fall times ..................................... 1ns
Input timing reference levels ........................ 1.25V
Output reference levels ................................. 1.25V
Output load ............................. See Figures 3 and 4
4Mb: 256K x 18, 128K x 32/36
2.5V I/O Output Load Equivalents
Micron Technology, Inc., reserves the right to change products or specifications without notice.
Q
Q
225Ω
PIPELINED ZBT SRAM
Z = 50Ω
O
Figure 3
Figure 4
+2.5V
V = 1.25V
T
225Ω
5pF
50Ω
©2003, Micron Technology, Inc.
SS
to 2.5V

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