MT8926AE Zarlink Semiconductor, MT8926AE Datasheet - Page 25

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MT8926AE

Manufacturer Part Number
MT8926AE
Description
MT8926 - T1 Performance Monitoring Adjunct Circuit (PMAC)
Manufacturer
Zarlink Semiconductor
Datasheet
SEMICMF.019
Data Sheet
Absolute Maximum Ratings*
* Exceeding these values may cause permanent damage. Functional operation under these conditions is not implied.
Recommended Operating Conditions
‡ Typical figures are at 25 C and are for design aid only: not guaranteed and not subject to production testing.
DC Electrical Characteristics -
‡ Typical figures are at 25 C and are for design aid only: not guaranteed and not subject to production testing.
AC Electrical Characteristics
‡ Typical figures are at 25 C and are for design aid only: not guaranteed and not subject to production testing.
† Timing is over recommended temperature ranges and power supply voltages.
1
2
3
4
5
6
1
2
3
4
1
2
1
2
3
4
5
Supply Current
Input High Voltage
Input Low Voltage
Input Leakage Current
Output High Current
Output Low Current
Operating Temperature
Power Supplies
Input High Voltage
Input Low Voltage
Input Pin Capacitance
Output Pin Capacitance
Power Supplies with respect to V
Voltage on any pin other than supplies
Current at any pin other than supplies
Storage Temperature
Continuous Power Dissipation
Characteristics
Parameters
Parameters
Parameter
- Capacitance
SS
Clocked operation over recommended temperature ranges and power supply voltages.
Sym
Sym
Sym
T
V
V
I
V
I
V
I
C
V
I
OH
C
DD
OL
OP
DD
IL
IH
IH
IL
IL
O
I
- Voltages are with respect to ground (V
2.25
Min
V
Min
V
Min
-40
4.5
2.4
8
8
SS
SS
Typ
Typ
Typ
5.0
10
10
Symbol
V
T
P
DD
ST
D
Max
Max
Max
V
V
5.5
0.4
0.8
85
5
DD
10
DD
Units
Units
Units
V
mA
mA
mA
pF
pF
V
V
V
V
V
SS
C
Min
-0.3
A
-40
SS
-0.3
) unless otherwise stated.
Noise margin = 150 mV
Noise margin = 400 mV
Outputs Unloaded
Digital Inputs
V
V
V
IN
OH
OL
=0 to V
=0.4V
=2.4V
Test Conditions
Test Conditions
Test Conditions
V
DD
Max
125
500
40
7
+0.3
DD
MT8926
Units
mW
mA
V
V
C
25
.

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