80C32-16 TEMIC Semiconductors, 80C32-16 Datasheet - Page 13

• Manufacturer Part Number: 80C32-16
• Description: CMOS 0 to 44 MHz Single Chip 8bit Microntroller
• Manufacturer: TEMIC Semiconductors

Rev. G (14 Jan. 97)
Absolute Maximum Ratings*
Ambient Temperature Under Bias :
C = Commercial
Storage Temperature
Voltage on VCC to VSS
Voltage on Any Pin to VSS
Power Dissipation
** This value is based on the maximum allowable die temperature and
the thermal resistance of the package
MATRA MHS
DC Characteristics
TA = 0 C to 70 C ; Vcc = 2.7 V to 5.5 V ; Vss = 0 V ; F = 0 to 16 MHz
TA = –40 C to 85 C ; Vcc = 2.7 V to 5.5 V
Maximum Icc (mA)
Freq > 12 MHz (Vcc = 5.5 V)
SYMBOL
FREQUENCY/Vcc
VOH1
VOL1
RRST
VIH2
VIH1
VOL
VOH
VPD
VIH
CIO
VIL
ITL
IPD
IIL
ILI
12 MHz
16 MHz
1 MHz
6 MHz
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Low Voltage
Input High Voltage (Except XTAL and RST)
Input High Voltage to RST for Reset
Input High Voltage to XTAL1
Power Down Voltage to Vcc in PD Mode
Output Low Voltage (Ports 1, 2, 3)
Output Low Voltage Port 0, ALE, PSEN
Output High Voltage Ports 1, 2, 3
Output High Voltage (Port 0 in External Bus
Mode), ALE, PSEN
Logical 0 Input Current Ports 1, 2, 3
Input Leakage Current
Logical 1 to 0 Transition Current
(Ports 1, 2, 3)
Power Down Current
RST Pulldown Resistor
Capacitance of I/O Buffer
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . .
0.8 mA
10 mA
2.7 V
4 mA
8 mA
PARAMETER
Icc (mA) = 1.25 Freq (MHz) + 5
Icc Idle (mA) = 0.36
OPERATING (NOTE 1)
–0.5 V to VCC + 0.5 V
10 mA
12 mA
1 mA
5 mA
3 V
–65
–0.5 V to + 7 V
0
Freq (MHz) + 2.7
to + 150
1.1 mA
12 mA
14 mA
to 70
6 mA
3.3 V
1 W**
0.2 V
0.7 V
0.7 V
0.9 Vcc
0.9 Vcc
MIN
– 0.5
* Notice
Stresses at or above those listed under “ Absolute Maximum Ratings”
may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions may affect
device reliability.
2.0
CC
50
1.8 mA
10 mA
5.5 V
CC
CC
+ 1.4
0.2 V
V
V
V
CC
CC
CC
MAX
400 A
1.5 mA
2.5 mA
– 650
0.45
0.45
– 50
2.7 V
3 mA
200
5.5
CC
50
10
10
+ 0.5
+ 0.5
+ 0.5
– 0.1
80C32/80C52
UNIT
k
500 A
1.7 mA
3.8 mA
pF
V
V
V
V
V
V
V
V
V
3 mA
A
A
A
A
IDLE (NOTE 1)
3 V
IOL = 0.8 mA (note 2)
IOL = 1.6 mA (note 2)
IOH = – 10 A
IOH = – 40 A
Vin = 0.45 V
0.45 < Vin < V
Vin = 2.0 V
V
fc = 1 MHz, T
CC
TEST CONDITIONS
= 2.0 V to 5.5 V (note 1)
600 A
3.5 mA
4.5 mA
3.3 V
2 mA
A
CC
= 25 C
5.5 V
1 mA
4 mA
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