MX28F2000P Macronix International, MX28F2000P Datasheet - Page 12

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MX28F2000P

Manufacturer Part Number
MX28F2000P
Description
2M-BIT [256K x 8] CMOS FLASH MEMORY
Manufacturer
Macronix International
Datasheet

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AC CHARACTERISTICS
TEST CONDITIONS:
• Input pulse levels: 0.45V/2.4V
• Input rise and fall times: < 10ns
• Output load: 1 TTL gate + 100pF (Including scope and jig)
• Reference levels for measuring timing: 0.8V, 2.0V
READ TIMING WAVEFORMS
P/N: PM0380
SYMBOL
tACC
tCE
tOE
tDF
tOH
DATA OUT
ADDRESS
PARAMETER
Address to Output Delay
CE to Output Delay
OE to Output Delay
OE High to Output Float
Address to Output hold
WE
CE
OE
STANDBY MODE
TA = 0
o
(
C to 70
Note1)
o
C, VCC = 5V ± 10%, VPP = GND to VCC
MIN.
0
0
28F2000P-70
MAX. MIN.
70
70
40
20
tACC
12
NOTE:
1. tDF is defined as the time at which the output achieves the
0
0
ACTIVE MODE
28F2000P-90 28F2000P-12
tCE
open circuit condition and data is no longer driven.
tOE
MAX. MIN.
90
90
40
20
0
0
MX28F2000P
MAX.
120
120
50
30
DATA OUT VALID
ns
ns
UNIT CONDITIONS
ns
ns
ns
tOH
CE=OE=VIL
OE=VIL
CE=VIL
CE=VIL
CE=OE=VIL
STANDBY MODE
tDF
REV. 1.5, OCT 29, 1998

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